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P93U422 Datasheet(PDF) 4 Page - Pyramid Semiconductor Corporation |
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P93U422 Datasheet(HTML) 4 Page - Pyramid Semiconductor Corporation |
4 / 10 page P93U422 Page 4 of 10 Document # SRAM102 REV A SWITCHING TEST Test Circuits (7, 8) Notes: 5) Test conditions assume signal transition times of 10 ns or less. 6) Extended temperature operation guaranteed with 400 linear feet per minute of air flow. 7) t PLH (A) and t PHL (A) are tested with S 1 closed and CL = 15 pF with both input and output timing referenced to 1.5V 8) t PZH(WE), tPZH(CS1, CS2) and tPZH(OE) are measured with S1 open, CL = 15 pF and with both the input and output timing referenced to 1.5V. t PZL(WE), tPZL(CS1, CS2) and tPZL(OE) are measured with S1 closed, CL = 15pF and with both the input and output timing referenced to 1.5V. t PHZ(WE), tPHZ(CS1, CS2) and tPHZ(OE) are measured with S1 open, CL < 5pF and are measured between the 1.5V level on the input to the V OH -500mV level on the output. t PLZ(WE), tPLZ(CS1, CS2) and tPLZ(OE) are measured with S1 closed, CL < 5pF and are measured between the 1.5V level on the input to the V OL +500mV level on the output. |
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