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DS2755E+ Datasheet(PDF) 4 Page - Dallas Semiconductor |
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DS2755E+ Datasheet(HTML) 4 Page - Dallas Semiconductor |
4 / 20 page DS2755: High-Accuracy Battery Fuel Gauge with Snapshot 4 of 20 ELECTRICAL CHARACTERISTICS—1-WIRE INTERFACE (2.5V ≤ VDD ≤ 5.5V, TA = -20°C to +70°C.) PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS Snapshot Trigger 0 tSWL 1 16 μs Snapshot Delay tSDLY 80 100 120 μs STANDARD TIMING Time Slot tSLOT 60 120 μs Recovery Time tREC 1 μs Write-0 Low Time tLOW0 60 119 μs Write-1 Low Time tLOW1 1 15 μs Read Data Valid tRDV 15 μs Reset Time High tRSTH 480 μs Reset Time Low tRSTL 480 960 μs Presence-Detect High tPDH 15 60 μs Presence-Detect Low tPDL 60 240 μs Interrupt Time Low tIL 480 1920 μs OVERDRIVE TIMING Time Slot tSLOT 6 16 μs Recovery Time tREC 1 μs Write-0 Low Time tLOW0 6 16 μs Write-1 Low Time tLOW1 1 2 μs Read Data Valid tRDV 2 μs Reset Time High tRSTH 48 μs Reset Time Low tRSTL 48 80 μs Presence-Detect High tPDH 2 6 μs Presence-Detect Low tPDL 8 24 μs Interrupt Time Low tIL 48 192 μs EEPROM RELIABILITY SPECIFICATION (2.5V ≤ VDD ≤ 5.5V, TA = -20°C to +70°C.) PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS Copy to EEPROM Time tEEC 2 10 ms EEPROM Copy Endurance NEEC (Note 11) 50,000 cycles Note 1: All voltages are referenced to VSS. Note 2: Specifications relative to VIS1 - VIS2. Note 3: The DS2755 requires a maximum of 25µAH of charge to transition into sleep mode. Note 4: Summation of worst case time base and current measurement sampling errors. Note 5: Continuous offset cancellation corrects offset errors in the current measurement system. Individual values reported by the Current register have a maximum offset of ±0.5 LSb’s (±7.8125 μV). Individual values reported in the Average Current register have a maximum offset of ±2 LSb’s (±7.8125 μV). Note 6: Current Gain Error specifies the gain error in the Current register value compared to a reference voltage between IS1 and IS2. The DS2755 does not compensate for sense resistor characteristics, and any error terms arising from the sense resistor should be taken into account when calculating total current measurement error. Note 7: Achieving the 24 Hour Accumulated Current Error assumes positive offset accumulation blanking is enabled (OBEN bit set) and can require a one time 3.5s in-system calibration after mounting to the printed circuit board. Variations in temperature and supply voltage are compensated for by periodic offset corrections performed automatically during Active mode operation. Note 8: Voltage offset measurement is with respect to 4.2V at +25°C. Note 9: Self heating due to output pin loading and sense resistor power dissipation can alter the Temperature reading from ambient conditions. Note 10: Typical value for tERR valid at 3.7V and +25°C. tERR applies to all internal timings (ex. fSAMP, tSLEEP, tUVD) except for the 1-Wire Interface timings. Note 11: Four year data retention at +50 °C. |
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