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TC7107 Datasheet(PDF) 4 Page - Microchip Technology |
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TC7107 Datasheet(HTML) 4 Page - Microchip Technology |
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4 / 32 page  TC7106/A/TC7107/A DS21455C-page 4 © 2006 Microchip Technology Inc. 1.0 ELECTRICAL CHARACTERISTICS Absolute Maximum Ratings* TC7106A Supply Voltage (V+ to V-) .......................................15V Analog Input Voltage (either Input) (Note 1) ... V+ to V- Reference Input Voltage (either Input) ............ V+ to V- Clock Input ................................................... Test to V+ Package Power Dissipation (TA ≤ 70°C) (Note 2): 40-Pin CERDIP .......................................2.29W 40-Pin PDIP ............................................1.23W 44-Pin PLCC ...........................................1.23W 44-Pin PQFP ...........................................1.00W Operating Temperature Range: C (Commercial) Devices .............. 0°C to +70°C I (Industrial) Devices ................ -25°C to +85°C Storage Temperature Range ..............-65°C to +150°C TC7107A Supply Voltage (V+) ...............................................+6V Supply Voltage (V-)..................................................-9V Analog Input Voltage (either Input) (Note 1) ... V+ to V- Reference Input Voltage (either Input) ............ V+ to V- Clock Input ..................................................GND to V+ Package Power Dissipation (TA ≤ 70°C) (Note 2): 40-Pin CERDip ........................................2.29W 40-Pin PDIP ............................................1.23W 44-Pin PLCC ...........................................1.23W 44-Pin PQFP ...........................................1.00W Operating Temperature Range: C (Commercial) Devices .............. 0°C to +70°C I (Industrial) Devices ................ -25°C to +85°C Storage Temperature Range ..............-65°C to +150°C *Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions above those indicated in the operation sections of the specifications is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. |
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