Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Many-Time Programmable Flash

SST37VF512 / SST37VF010 / SST37VF020 / SST37VF040

5

©2006 Silicon Storage Technology, Inc.

S71151-07-000

8/06

Absolute Maximum Stress Ratings (Applied conditions greater than those listed under “Absolute Maximum

Stress Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation

of the device at these conditions or conditions greater than those defined in the operational sections of this data

sheet is not implied. Exposure to absolute maximum stress rating conditions may affect device reliability.)

Temperature Under Bias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55°C to +125°C

Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -65°C to +150°C

Through Hole Lead Soldering Temperature (10 Seconds) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 300°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . “non-Pb” units: 260°C for 3 seconds

1. Certain “with-Pb” package types are capable of 260°C for 3 seconds; please consult the factory for the latest information.

2. Outputs shorted for no more than one second. No more than one output shorted at a time.

Range

Ambient Temp

Commercial

0°C to +70°C

2.7-3.6V

Input Rise/Fall Time . . . . . . . . . . . . . . . 5 ns

See Figures 8 and 9

TABLE

Symbol

Parameter

Limits

Test Conditions

Min

Max

Units

12

mA

15

µA

Input Leakage Current

1

µA

Output Leakage Current

10

µA

Input Low Voltage

0.8

V

Input High Voltage

Input High Voltage (CMOS)

V

Output Low Voltage

0.2

V

Output High Voltage

V

200

µA

T4.6 1151