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SST31LF021E Datasheet(PDF) 4 Page - Silicon Storage Technology, Inc |
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SST31LF021E Datasheet(HTML) 4 Page - Silicon Storage Technology, Inc |
4 / 24 page 4 EOL Data Sheet 2 Mbit Flash + 1 Mbit SRAM ComboMemory SST31LF021 / SST31LF021E ©2007 Silicon Storage Technology, Inc. S71137-06-EOL 05/07 Flash Data# Polling (DQ7) When the SST31LF021/021E flash memory bank is in the internal Program operation, any attempt to read DQ7 will produce the complement of the true data. Once the Pro- gram operation is completed, DQ7 will produce true data. Note that even though DQ7 may have valid data immedi- ately following the completion of an internal Write opera- tion, the remaining data outputs may still be invalid: valid data on the entire data bus will appear in subsequent suc- cessive Read cycles after an interval of 1 µs. During inter- nal Erase operation, any attempt to read DQ7 will produce a ‘0’. Once the internal Erase operation is completed, DQ7 will produce a ‘1’. The Data# Polling is valid after the rising edge of the fourth WE# (or BEF#) pulse for Program opera- tion. For Sector or Bank-Erase, the Data# Polling is valid after the rising edge of the sixth WE# (or BEF#) pulse. See Figure 7 for Data# Polling timing diagram and Figure 17 for a flowchart. Flash Toggle Bit (DQ6) During the internal Program or Erase operation, any con- secutive attempts to read DQ6 will produce alternating 0s and 1s, i.e., toggling between 0 and 1. When the internal Program or Erase operation is completed, the toggling will stop. The flash memory bank is then ready for the next operation. The Toggle Bit is valid after the rising edge of the fourth WE# (or BE#) pulse for Program operation. For Sec- tor or Bank-Erase, the Toggle Bit is valid after the rising edge of the sixth WE# (or BEF#) pulse. See Figure 8 for Toggle Bit timing diagram and Figure 17 for a flowchart. Flash Memory Data Protection The SST31LF021/021E flash memory bank provides both hardware and software features to protect nonvolatile data from inadvertent writes. Flash Hardware Data Protection Noise/Glitch Protection: A WE# or BEF# pulse of less than 5 ns will not initiate a Write cycle. VDD Power Up/Down Detection: The Write operation is inhibited when is less than 1.5V. Write Inhibit Mode: Forcing OE# low, BEF# high, or WE# high will inhibit the Flash Write operation. This prevents inadvertent writes during power-up or power-down. Flash Software Data Protection (SDP) The SST31LF021/021E provide the JEDEC approved Software Data Protection scheme for all flash memory bank data alteration operations, i.e., Program and Erase. Any Program operation requires the inclusion of a series of three-byte sequence. The three-byte load sequence is used to initiate the Program operation, providing optimal protection from inadvertent Write operations, e.g., during the system power-up or power-down. Any Erase operation requires the inclusion of six-byte load sequence. The SST31LF021/021E devices are shipped with the Software Data Protection permanently enabled. See Table 4 for the specific software command codes. During SDP command sequence, invalid SDP commands will abort the device to the Read mode, within TRC. Concurrent Read and Write Operations The SST31LF021/021E provide the unique benefit of being able to read from or write to SRAM, while simulta- neously erasing or programming the flash. The device will ignore all SDP commands when an Erase or Program operation is in progress. This allows data alteration code to be executed from SRAM, while altering the data in flash. The following table lists all valid states. SST does not rec- ommend that both bank enables, BEF# and BES#, be simultaneously asserted. Note that Product Identification commands use SDP; therefore, these commands will also be ignored while an Erase or Program operation is in progress. CONCURRENT READ/WRITE STATE TABLE Flash SRAM Program/Erase Read Program/Erase Write |
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