Philips Semiconductors Programmable Logic Devices

Product specification

PLUS173B/D

Programmable logic arrays

(22

× 42 × 10)

October 22, 1993

36

DC ELECTRICAL CHARACTERISTICS

0

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

MIN

MAX

UNIT

Low

0.8

V

High

2.0

V

Clamp

–0.8

–1.2

V

0.5

V

2.4

V

Low

–100

µA

High

40

µA

Output current

80

µA

–140

–15

–70

mA

150

200

mA

Capacitance

Input

8

pF

I/O

15

pF

NOTES:

2. All voltage values are with respect to network ground terminal.

3. Test one at a time.

4. Measured with inputs I0 – I4 = 0V, inputs I5 – I9 = 4.5V, I11 = 4.5V and I19 = 10V. For outputs B0 – B4 and for outputs B5 – B9 apply the

same conditions except I11 = 0V.

5. Same conditions as Note 4 except input I11 = +10V.

6. Duration of short circuit should not exceed 1 second.

8. Leakage values are a combination of input and output leakage.