SN65HVD233

SN65HVD234

SN65HVD235

SLLS557D − NOVEMBER 2002 REVISED JUNE 2005

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3

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during

storage or handling to prevent electrostatic damage to the MOS gates.

AVAILABLE OPTIONS

PART NUMBER

LOW POWER MODE

SLOPE

CONTROL

DIAGNOSTIC

LOOPBACK

AUTOBAUD

LOOPBACK

SN65HVD233D

200-

µA standby mode

Adjustable

Yes

No

SN65HVD234D

200-

µA standby mode or 50-nA sleep mode

Adjustable

No

No

SN65HVD235D

200-

µA standby mode

Adjustable

No

Yes

(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document,

or see the TI web site at www.ti.com.

ORDERING INFORMATION

PACKAGE (D)

MARKED AS

SN65HVD233D

VP233

SN65HVD233DR(1)

VP233

SN65HVD234D

VP234

SN65HVD234DR(1)

VP234

SN65HVD235D

VP235

SN65HVD235DR(1)

VP235

(1) R suffix indicated tape and reel

POWER DISSIPATION RATINGS

PACKAGE

CIRCUIT

BOARD

TA ≤ 25°C

POWER RATING

DERATING FACTOR(1)

ABOVE TA = 25°C

TA = 85°C POWER

RATING

TA = 125°C POWER

RATING

D

Low-K

596.6 mW

5.7 mW/

°C

255.7 mW

28.4 mW

D

High-K

1076.9 mW

10.3 mW/

°C

461.5 mW

51.3 mW

(1) This is the inverse of the junction-to-ambient thermal resistance when board-mounted and with no air flow.

over operating free-air temperature range unless otherwise noted

PARAMETER

VALUE

Supply voltage range, VCC

−0.3 V to 7 V

Voltage range at any bus terminal (CANH or CANL)

−36 V to 36 V

Voltage input range, transient pulse, CANH and CANL, through 100

Ω (see Figure 7)

−100 V to 100 V

Input voltage range, VI (D, R, RS, EN, LBK, AB)

−0.5 V to 7 V

Receiver output current, IO

−10 mA to 10 mA

Electrostatic discharge

Human Body Model(3)

CANH, CANL and GND

16 kV

Electrostatic discharge

Human Body Model(3)

All pins

3 kV

Electrostatic discharge

Charged-Device Mode(4)

All pins

1 kV

Continuous total power dissipation

See Dissipation Rating Table

Operating junction temperature, TJ

150

°C

(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and

functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not

implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.

(3) Tested in accordance with JEDEC Standard 22, Test Method A114−A.

(4) Tested in accordance with JEDEC Standard 22, Test Method C101.