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MC9S12A128 Datasheet(PDF) 100 Page - Freescale Semiconductor, Inc

Part # MC9S12A128
Description  Device User Guide
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Manufacturer  FREESCALE [Freescale Semiconductor, Inc]
Direct Link  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

MC9S12A128 Datasheet(HTML) 100 Page - Freescale Semiconductor, Inc

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Device User Guide — 9S12DT128DGV2/D V02.15
100
Freescale Semiconductor
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
A.1.7 Operating Conditions
This chapter describes the operating conditions of the device. Unless otherwise noted those conditions
apply to all the following data.
NOTE:
Please refer to the temperature rating of the device (C, V, M) with regards to the
ambient temperature TA and the junction temperature TJ. For power dissipation
Table A-2 ESD and Latch-up Test Conditions
Model
Description
Symbol
Value
Unit
Human Body
Series Resistance
R1
1500
Ohm
Storage Capacitance
C
100
pF
Number of Pulse per pin
positive
negative
–
–
3
3
Machine
Series Resistance
R1
0
Ohm
Storage Capacitance
C
200
pF
Number of Pulse per pin
positive
negative
–
–
3
3
Latch-up
Minimum input voltage limit
–2.5
V
Maximum input voltage limit
7.5
V
Table A-3 ESD and Latch-Up Protection Characteristics
Num
C
Rating
Symbol
Min
Max
Unit
1
C Human Body Model (HBM)
VHBM
2000
–
V
2
C Machine Model (MM)
VMM
200
–
V
3
C Charge Device Model (CDM)
VCDM
500
–
V
4
C
Latch-up Current at 125
°C
positive
negative
ILAT
+100
–100
–
mA
5
C
Latch-up Current at 27
°C
positive
negative
ILAT
+200
–200
–
mA


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