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MC146012 Datasheet(PDF) 3 Page - Freescale Semiconductor, Inc |
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MC146012 Datasheet(HTML) 3 Page - Freescale Semiconductor, Inc |
3 / 18 page Sensors Freescale Semiconductor 3 MC146012 This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of voltages any higher than maximum rated voltages to this high-impedance circuit. For proper operation, VIN and VOUT should be constrained to a range of VSS ≤ (VIN or VOUT) ≤ VDD except for I/O pin which can exceed VDD, and the Test/Mute input, which can go below VSS. Unused inputs must always be tied to an appropriate logic voltage level (e.g. either VSS or VDD). Unused outputs and/or an unused I/O must be left open. Table 1. Maximum Ratings(1) (Voltages Referenced to VSS) 1. Maximum ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the limits in the electrical characteristics tables. Symbol Parameter Value Unit VDD DC Supply Voltage -0.5 to +12 V VIN DC Input Voltage C1, C2, Detect Osc, Low-Supply Trip I/O Feedback Test -0.25 to VDD +0.25 -0.25 to VDD +0.25 -0.25 to VDD +10 -15 to +25 -1.0 to VDD +0.25 V IIN DC Input Current, per Pin ±10 mA IOUT DC Output Current, per Pin ±25 mA IDD DC Supply Current, VDD/VSS pins (15 Seconds in Reverse Dir.) +25 Forward -150 Reverse mA PD Power Dissipation † in Stil Air, 5 sec. †† Continuous 1200(2) 350(3) 2. Derating: -12 mW/°C from 25°C to 60°C. 3. Derating: -3.5 mW/°C from 25°C to 60°C. mW Tstg Storage Temperature -55 to +125 °C TA Operating Temperature -25 to +75 °C TL Lead Temperature, 1 mm from case for 10 seconds 260 °C Table 2. Electrical Characteristics (Voltages Referenced to VSS, TA = -10 to 60°C unless otherwise indicated.) Symbol Parameter Test Condition Test Pin VDD Min Max Unit VDD Power Supply Voltage Range — — 6.0 12 V VTH Supply Threshold Voltage, Low Supply Alarm Low Supply Trip: VIN = VDD/3 15 — 7.2 7.8 V IDD Average Operating Supply Current (per Package) (Does not include Current through D3-IR Emitter) Standby Configured per Figure 5 — — 12 9.0 — — 9.0 7.0 µA IDD Peak Supply Current (per Package) (Does not include IRED Current into base of Q1) During Strobe On, IRED Off Configured per Figure 5 During Strobe On, IRED On Configured per Figure 5 — — 12 12 — — 1.25 2.5 mA VIL Low Level Input Voltage I/O Feedback Test 7.0 10 16 9.0 9.0 9.0 — — — 1.5 2.7 0.5 V VIM Mid Level Input Voltage Test 16 9.0 2.0 VDD-2.0 V VIH High Level Input Voltage I/O Feedback Test 7.0 10 16 9.0 9.0 9.0 3.2 6.3 8.5 — — — V IIN Input Current OSC, Detect Low-Supply Trip Feedback Test VIN = VSS or VDD VIN = VSS or VDD VIN = VSS or VDD VIN = VSS or VDD 3.12 15 10 16 12 12 12 12 -100 -100 -100 -100 +100 +100 +100 +100 nA IIL Test Mode Input Current VIN = VSS or VDD 16 12 -100 -1.0 µA |
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