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SCANSTA112VS Datasheet(PDF) 7 Page - National Semiconductor (TI) |
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SCANSTA112VS Datasheet(HTML) 7 Page - National Semiconductor (TI) |
7 / 15 page TABLE 1. Pin Descriptions (Continued) Pin Name Description No. Pins I/O TRIST B0, TRISTB1, TRIST (01-03) 5 O TRI-STATE NOTIFICATION OUTPUT: This signal is asserted high when the associated TDO is TRI-STATEd. Associated means TRIST B0 is for TDOB0, TRIST01 is for TDO01, etc. This output has 12mA of drive current. A0 B0,A1B0,A0B1, A1 B1 4 I BACKPLANE PASS-THROUGH INPUT: A general purpose input which is driven to the Y n of a single selected LSP. (Not available when multiple LSPs are selected). This input has a 25K Ω internal pull-up resistor. MPsel B1/B0 determines which port is the master backplane port and which is LSP 00. Y0 B0,Y1B0,Y0B1, Y1 B1 4 O BACKPLANE PASS-THROUGH OUTPUT: A general purpose output which is driven from the A n of a single selected LSP. (Not available when multiple LSPs are selected). This TRI-STATE output has 12mA of drive current. MPsel B1/B0 determines which port is the master backplane port and which is LSP 00. S (0-7) 8 I SLOT IDENTIFICATION: The configuration of these pins is used to identify (assign a unique address to) each ’STA112 on the system backplane OE 1 I OUTPUT ENABLE for the Local Scan Ports, active low. When high, this active-low control signal TRI-STATEs all local scan ports on the ’STA112, to enable an alternate resource to access one or more of the local scan chains. TDO (01-06) 6 O TEST DATA OUTPUTS: Individual output for each of the local scan ports . These TRI-STATE outputs have 12mA of drive current. TDI (01-06) 6 I TEST DATA INPUTS: Individual scan data input for each of the local scan ports. This input has a 25K Ω internal pull-up resistor. TMS (01-06) 6 O TEST MODE SELECT OUTPUTS: Individual output for each of the local scan ports. TMS n does not provide a pull-up resistor (which is assumed to be present on a connected TMS input, per the IEEE 1149.1 requirement) . These TRI-STATE outputs have 24mA of drive current. TCK (01-06) 6 O LOCAL TEST CLOCK OUTPUTS: Individual output for each of the local scan ports. These are buffered versions of TCK B . These TRI-STATE outputs have 24mA of drive current. TRST (01-06) 6 O LOCAL TEST RESETS: A gated version of TRST B. These TRI-STATE outputs have 24mA of drive current. A0 01,A101 2 I LOCAL PASS-THROUGH INPUTS: General purpose inputs which can be driven to the backplane pin Y B. (Only on LSP0 and LSP1. Only available when a single LSP is selected) . These inputs have a 25K Ω internal pull-up resistor. Y0 01,Y101 2 O LOCAL PASS-THROUGH OUTPUT: General purpose outputs which can be driven from the backplane pin A B. (Only on LSP0 and LSP1. Only available when a single LSP is selected) . These TRI-STATE outputs have 12mA of drive current. Note 1: Refer to the IBIS model on our website for I/O characteristics. Application Overview ADDRESSING SCHEME The SCANSTA112 architecture extends the functionality of the IEEE 1149.1 Standard by supplementing that protocol with an addressing scheme which allows a test controller to communicate with specific ’STA112s within a network of ’STA112s. That network can include both multi-drop and hierarchical connectivity. In effect, the ’STA112 architecture allows a test controller to dynamically select specific portions of such a network for participation in scan operations. This allows a complex system to be partitioned into smaller blocks for testing purposes. The ’STA112 provides two levels of test-network partitioning capability. First, a test controller can select individual ’STA112s, specific sets of ’STA112s (multi-cast groups), or all ’STA112s (broadcast). This ’STA112-selection process is supported by a Level-1 com- munication protocol. Second, within each selected ’STA112, a test controller can select one or more of the chip’s seven local scan-ports. That is, individual local ports can be se- lected for inclusion in the (single) scan-chain which a ’STA112 presents to the test controller. This mechanism allows a controller to select specific scan-chains within the overall scan network. The port-selection process is sup- ported by a Level-2 protocol. HIERARCHICAL SUPPORT Multiple SCANSTA112’s can be used to assemble a hierar- chical boundary-scan tree. In such a configuration, the sys- tem tester can configure the local ports of a set of ’STA112s so as to connect a specific set of local scan-chains to the active scan chain. Using this capability, the tester can selec- tively communicate with specific portions of a target system. The tester’s scan port is connected to the backplane scan port of a root layer of ’STA112s, each of which can be www.national.com 7 |
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