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TPS2065DGNR-1 Datasheet(PDF) 2 Page - Texas Instruments |
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TPS2065DGNR-1 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 28 page www.ti.com ABSOLUTE MAXIMUM RATINGS TPS2062-1 TPS2065-1 TPS2066-1 SLVS714 – FEBRUARY 2007 These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. AVAILABLE OPTION AND ORDERING INFORMATION(1) RECOMMENDED TYPICAL PACKAGED MAXIMUM SHORT-CIRCUIT NUMBER OF DEVICES (2) TA ENABLE CONTINUOUS CURRENT LIMIT SWITCHES MSOP (DGN) SOIC(D) LOAD CURRENT AT 25 °C Active high Single TPS2065DGN-1 –40 °C to 85°C Active low 1 A 1.5 A TPS2062D-1 Dual Active high TPS2066DGN-1 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. (2) The package is available taped and reeled. Add an R suffix to device types (e.g., TPS2062-1DR). ORDERING INFORMATION TA SOIC(D) STATUS MSOP (DGN) STATUS TPS2062D Active Active –40 °C to 85°C Active TPS2065DGN Active Active TPS2066DGN Active over operating free-air temperature range unless otherwise noted(1) UNIT Input voltage range, VI(IN)(2) –0.3 V to 6 V Output voltage range, VO(OUT)(2), VO(OUTx) -0.3 V to 6 V Input voltage range, VI(EN), VI(EN), VI(ENx), VI(ENx) –0.3 V to 6 V Voltage range, VI(OC), VI(OCx) –0.3 V to 6 V Continuous output current, IO(OUT), IO(OUTx) Internally limited Continuous total power dissipation See Dissipation Rating Table Operating virtual junction temperature range, TJ -40 °C to 125°C Storage temperature range, Tstg –65 °C to 150°C Human body model MIL-STD-883C 2 kV Electrostatic discharge (ESD) protection Charge device model (CDM) 500 V (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltages are with respect to GND. 2 Submit Documentation Feedback |
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