www.ti.com

ABSOLUTE MAXIMUM RATINGS

(1)

INA203

INA204

INA205

SBOS393 – MARCH 2007

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be

more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

EXTERNAL

INTERNAL

COMP1 AND

COMP1 AND

COMP2

PACKAGE-

PACKAGE

PACKAGE

1.2V

COMP2

COMP2

DELAY

PRODUCT

GAIN

LEAD

DESIGNATOR

MARKING

REF OUT

REF INPUTS

0.6V REF

PIN

D

INA203A

X

X

X

X

INA203

20V/V

MSOP-10

DGS

BQN

X

PW

INA203A

X

X

X

X

D

INA204A

X

X

X

X

INA204

50V/V

MSOP-10

DGS

BQO

X

PW

INA204A

X

X

X

X

D

INA205A

X

X

X

X

INA205

100V/V

MSOP-10

DGS

BQP

X

PW

INA205A

X

X

X

X

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Available Q3, 2007.

VALUE

UNIT

Supply Voltage, V+

18

V

–18 to +18

V

Common-Mode

–16 to +80

V

Comparator Analog Input and Reset Pins

GND – 0.3 to (V+) + 0.3

V

Analog Output, Out Pin

GND – 0.3 to (V+) + 0.3

V

Comparator Output, Out Pin

GND – 0.3 to 18

V

GND – 0.3 to 10

V

Input Current Into Any Pin

5

mA

Operating Temperature

–55 to +150

°C

Storage Temperature

–65 to +150

°C

Junction Temperature

+150

°C

ESD Ratings:

Human Body Model (HBM)

4000

V

Charged Device Model (CDM)

1000

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

2

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