Philips Semiconductors

Product specification

NE/SA568A

150MHz phase-locked loop

1996 Feb 1

2

ABSOLUTE MAXIMUM RATINGS

SYMBOL

PARAMETER

RATING

UNITS

Supply voltage

6

V

Junction temperature

+150

°C

Storage temperature range

-65 to +150

°C

Maximum power dissipation

400

mW

Thermal resistance

80

°C/W

ELECTRICAL CHARACTERISTICS

The elctrical characteristics listed below are actual tests (unless

otherwise stated) performed on each device with an automatic IC

tester prior to shipment. Performance of the device in automated

test set-up is not necessarily optimum. The NE568A is

layout-sensitive. Evaluation of performance for correlation to the

data sheet should be done with the circuit and layout of Figures 3, 4,

and 5 with the evaluation unit soldered in place. (Do not use a

socket!)

DC ELECTRICAL CHARACTERISTICS

SYMBOL

PARAMETER

TEST CONDITIONS

LIMITS

UNITS

SYMBOL

PARAMETER

TEST CONDITIONS

NE/SA568A

UNITS

MIN

TYP

MAX

Supply voltage

4.5

5

5.5

V

Supply current

54

70

mA

AC ELECTRICAL CHARACTERISTICS

SYMBOL

PARAMETER

TEST CONDITIONS

LIMITS

UNITS

SYMBOL

PARAMETER

TEST CONDITIONS

NE/SA568A

UNITS

MIN

TYP

MAX

150

MHz

Input signal level

50

2000

+10

dBm

BW

Demodulated bandwidth

MHz

Dev =

±20%, Input = -20dBm

1.0

4.0

%

Input = -20dBm

±25

±35

Input = -20dBm

±20

±30

Figure 3

100

ppm/

°C

1

k

Ω

Output impedance

6

Ω

Dev =

Pin 14

0.40

0.52

AM rejection

referred to

±20% deviation

50

dB

1.2k

-15

0

+15

%

Drift with supply

4.5V to 5.5V

2

%/V

NOTE:

1. Signal level to assure all published parameters. Device will continue to function at lower levels with varying performance.

3. Not 100% tested, but guaranteed by design.

4. Input impedance depends on package and layout capacitances. See Figures 6 and 5.

then calculated from a straight line over the deviation range specified.