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TRF3702 Datasheet(PDF) 2 Page - Texas Instruments |
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TRF3702 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 35 page www.ti.com +45 ° –45 ° Σ RFOUT IVIN IREF QVIN QREF LO 50 Ω VCC PWD GND B0002-01 TRF3702 SLWS149A – SEPTEMBER 2004 – REVISED AUGUST 2006 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. AVAILABLE OPTIONS TA 4-mm × 4-mm 16-Pin RHC (QFN) Package(1) TRF3702IRHC –40 °C to 85°C TRF3702IRHCR (Tape and reel) (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. FUNCTIONAL BLOCK DIAGRAM 2 Submit Documentation Feedback |
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