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FB2033 Datasheet(PDF) 6 Page - NXP Semiconductors

Part No. FB2033
Description  8-bit latched/registered/pass-thru Futurebus universal interface transceiver
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Maker  PHILIPS [NXP Semiconductors]
Homepage  http://www.nxp.com
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FB2033 Datasheet(HTML) 6 Page - NXP Semiconductors

 
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Philips Semiconductors
Product specification
FB2033
8-bit latched/registered/pass-thru
Futurebus+ universal interface transceiver
1995 May 25
6
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
UNIT
IOH
High level output current
B0 – Bn
VCC = MAX, VIL = MAX, VIH = MIN, VOH = 1.9V
100
µA
IOFF
Power-off output current
B0 – Bn
VCC = 0.0V, VIL = MAX, VIH = MIN, VOH = 1.9V
100
µA
VOH
High-level output voltage
AO0 – AOn 4
VCC = MIN, VIL = MAX, VIH = MIN, IOH = -3mA
2.5
2.85
V
VOL
Low-level output voltage
AO0 – AOn 4
VCC = MIN, VIL = MAX, VIH = MIN, IOL = 24mA
0.5
V
VOL
Low-level output voltage
B0 – Bn
VCC = MIN, VIL = MAX, VIH = MIN, IOL = 100mA
.75
1.0
1.15
V
OL
B0 – Bn
VCC = MIN, VIL = MAX, VIH = MIN, IOL = 4mA
0.5
VIK
Input clamp voltage
Except
B0–Bn
VCC = MIN, II = IIK
-0.5
V
VIK
Input clamp voltage
B0 – Bn
VCC = MIN, II = IIK 6
0.3
V
B0 – Bn
VCC = MIN, II = -18mA
-1.2
II
Input current at maximum
input voltage
Except
B0–Bn
VCC = MAX, VI = 0.0V or 5.5V
±50
µA
IIH
High-level input current
Except
B0–Bn
VCC = MAX, VI = 2.7V, Bn = AIn = 0V
20
µA
IIH
High-level input current
B0 – Bn
VCC = MAX, VI = 1.9V
100
µA
B0 – Bn
VCC = MAX, VI = 3.5V 5
100
mA
IIL
Low-level input current
Except
B0–Bn
VCC = MAX, VI = 0.5V
-20
µA
IIL
Low-level input current
B0 – Bn
VCC = MAX, VI = 0.75V
-100
µA
IOZH
Off-state output current
AO0 – AOn
VCC = MAX, VO = 2.7V
50
µA
IOZL
Off-state output current
AO0 – AOn
VCC = MAX, VO = 0.5V
-50
µA
IOS
Short-circuit output
current 3
AO0 – AOn
only
VCC = MAX, VO = 0.0V
-45
-150
mA
ICC
Supply current (total)
AIn to Bn
VCC = MAX, outputs Low or High
24
50
mA
ICC
Supply current (total)
Bn to AOn
VCC = MAX, outputs Low
45
75
mA
CC
Bn to AOn
VCC = MAX, outputs High
22
44
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operation conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
4. Due to test equipment limitations, actual test conditions are VIH = 1.8V and VIL = 1.3V for the B side.
5. For B port input voltage between 3 and 5 volts IIH will be greater than 100µA, but the parts will continue to function normally.
6. B0 – B7 clamps remain active for a minimum of 80ns following a High-to-Low transition.


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