 |
Electronic Components Datasheet Search |
|
|
Electronic Components Datasheet Search |
|
CR5527S Datasheet(PDF) 5 Page - NXP Semiconductors |
|
||||||||||||||||||||||||||||||
CR5527S Datasheet(HTML) 5 Page - NXP Semiconductors |
|
|
5 / 12 page 
1995 Apr 05 5 Philips Semiconductors Product specification Triple video driver hybrid amplifier CR5527S Fig.6 CRT amplifier test-circuit and block diagram. Test-circuit for one of the three CRT amplifiers. handbook, full pagewidth CR5527S C2 R2 input 50 Ω 2 1 4 3 output C L C1 R1 R3 MAM136 PULSE GENERATOR TEST FIXTURE CR5527S POWER SUPPLY FET PROBE SAMPLING OSCILLOSCOPE BIAS UNIT C4 C3 VS Components used in test-circuit (see Fig.6) Equipment used in test-circuit (see Fig.6) DESIGNATION DESCRIPTION VALUE C1 variable capacitor 10 to 160 pF (typ. 90 pF) C2 variable capacitor 10 to 160 pF (typ. 100 pF) C3 chip capacitor 10 nF C4 electrolytic capacitor 4.7 µF; 160 V R1 resistor typ. 348 Ω R2 resistor typ. 82 Ω R3 resistor 50 Ω EQUIPMENT TYPE DESCRIPTION Pulse generator Pico Second; Model 2600B Bias unit Pico Second; Model 5555 Power supply Philips; Model PE1541, 80 V FET probe Philips; Model PM8943, attenuation 100 : 1 Sampling oscilloscope Tektronix; Model 11803, sampling head SD24 |
English ▼
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
