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NBC12429AFAR2 Datasheet(PDF) 10 Page - ON Semiconductor |
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NBC12429AFAR2 Datasheet(HTML) 10 Page - ON Semiconductor |
10 / 21 page NBC12429, NBC12429A http://onsemi.com 10 S_CLOCK signal samples the information on the S_DATA line and loads it into a 14 bit shift register. Note that the P_LOAD signal must be HIGH for the serial load operation to function. The Test register is loaded with the first three bits, the N register with the next two, and the M register with the final nine bits of the data stream on the S_DATA input. For each register, the most significant bit is loaded first (T2, N1, and M8). A pulse on the S_LOAD pin after the shift register is fully loaded will transfer the divide values into the counters. The HIGH to LOW transition on the S_LOAD input will latch the new divide values into the counters. Figures 5 and 6 illustrate the timing diagram for both a parallel and a serial load of the device synthesizer. M[8:0] and N[1:0] are normally specified once at powerup through the parallel interface, and then possibly again through the serial interface. This approach allows the application to come up at one frequency and then change or fine--tune the clock as the ability to control the serial interface becomes available. The TEST output provides visibility for one of the several internal nodes as determined by the T[2:0] bits in the serial configuration stream. It is not configurable through the parallel interface. The T2, T1, and T0 control bits are preset to ‘000’ when P_LOAD is LOW so that the PECL FOUT outputs are as jitter--free as possible. Any active signal on the TEST output pin will have detrimental affects on the jitter of the PECL output pair. In normal operations, jitter specifications are only guaranteed if the TEST output is static. The serial configuration port can be used to select one of the alternate functions for this pin. |
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