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NUD3048MT1 Datasheet(PDF) 2 Page - ON Semiconductor |
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NUD3048MT1 Datasheet(HTML) 2 Page - ON Semiconductor |
2 / 4 page NUD3048 http://onsemi.com 2 MAXIMUM RATINGS Symbol Rating Value Unit VDSS Drain to Source Voltage – Continuous 100 V VG1SS Gate to Source Voltage – Continuous @ 1.0 mA 15 V ID Drain Current – Continuous (TA =25 _C) (Note 1) (Note 2) 0.7 1.2 A PD Power Dissipation (TA =25 _C) (Note 1) (Note 2) 0.66 1.56 W VG2SS Gate Resistor to Source Voltage – Continuous 100 V TJmax Maximum Junction Temperature 150 °C RqJA Thermal Impedance (Junction−to−Ambient) (Note 1) Thermal Impedance (Junction−to−Ambient) (Note 2) 190 80 °C/W ESD Human Body Model (HBM) Class 2 Machine Model Class A According to EIA/JESD22/A114 Specification 2000 160 V V Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. ELECTRICAL CHARACTERISTICS (TJ =25 _C unless otherwise noted.) Characteristic Symbol Min Typ Max Unit OFF CHARACTERISTICS Drain to Source Leakage Current (VDS = 80 V, VGS = 0 V) IDSS − 20 100 mA Gate Body Leakage Current (VGS =10 V, VDS = 0 V) (VGS = 10 V, VDS = 0 V, TJ = 125°C) IGSS IGSS − − 3.0 6.0 10 20 mA ON CHARACTERISTICS Gate Threshold Voltage (ID = 1.0 mA) VGS 1.3 1.7 2.0 V Drain to Source Resistance (VGS = 4.5 V, ID = 100 mA) RDS(on) − 0.65 0.82 W Drain to Source Resistance (VGS = 10 V, ID = 100 mA) RDS(on) − 0.6 0.72 W DYNAMIC CHARACTERISTICS Input Capacitance (VDS = 5.0 V, VGS = 0 V, f = 10 kHz) Ciss − 135 − pF Output Capacitance (VDS = 5.0 V, VGS = 0 V, f = 10 kHz) Coss − 75 − pF Transfer Capacitance (VDS = 5.0 V, VGS = 0 V, f = 10 kHz) Crss − 26 − pF GATE BIAS CHARACTERISTICS Gate Resistor RG 75 100 125 k W Gate Zener Breakdown Voltage (IZ = 1.0 mA) (Note 3) Gate Zener Breakdown Voltage (IZ = 3.0 mA) (Note 4) VZ 15 100 17 115 − − V 1. Min pad, 1 oz. Cu. 2. 1 inch pad, 1 oz Cu. 3. Measured from gate 1 to source. 4. Measured from gate 2 to source. |
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