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74F109 Datasheet(PDF) 3 Page - Fairchild Semiconductor

Part No. 74F109
Description  Dual JK Positive Edge-Triggered Flip-Flop
Download  7 Pages
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Maker  FAIRCHILD [Fairchild Semiconductor]
Homepage  http://www.fairchildsemi.com
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74F109 Datasheet(HTML) 3 Page - Fairchild Semiconductor

   
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Absolute Maximum Ratings(Note 1)
Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Storage Temperature
−65°C to +150°C
Ambient Temperature under Bias
−55°C to +125°C
Junction Temperature under Bias
−55°C to +175°C
VCC Pin Potential to
Ground Pin
−0.5V to +7.0V
Input Voltage (Note 2)
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State (with Vcc = 0V)
Standard Output
−0.5V to V
CC
3-STATE Output
−0.5V to +5.5V
Current Applied to Output
in LOW State (Max)
twice the rated IOL (mA)
Free Air Ambient Temperature
0
°C to +70°C
Supply Voltage
+4.5V to +5.5V
Symbol
Parameter
Min
Typ
Max
Units
VCC
Conditions
VIH
Input HIGH Voltage
2.0
V
Recognized as a HIGH Signal
VIL
Input LOW Voltage
0.8
V
Recognized as a LOW Signal
VCD
Input Clamp Diode Voltage
−1.2
V
Min
IIN = −18 mA
VOH
Output HIGH Voltage
10% VCC
2.5
VMin
IOH = −1 mA
5% VCC
2.7
IOH = −1 mA
VOL
Output LOW Voltage
10% VCC
0.5
V
Min
IOL = 20 mA
IIH
Input HIGH Current
5.0
µAMax
VIN = 2.7V
IBVI
Input HIGH Current Breakdown Test
7.0
µAMax
VIN = 7.0V
ICEX
Output HIGH Leakage Current
50
µAMax
VOUT = VCC
VID
Input Leakage Test
4.75
V
0.0
IID = 1.9 µA
All Other Pins Grounded
IOD
Output Leakage
3.75
µA0.0
VIOD = 150 mV
Circuit Current
All Other Pins Grounded
IIL
Input LOW Current
−0.6
mA
Max
VIN = 0.5V (Jn, Kn)
−1.8
mA
Max
VIN = 0.5V (CDn, SDn)
IOS
Output Short-Circuit Current
−60
−150
mA
Max
VOUT = 0V
ICC
Power Supply Current
11.7
17.0
mA
Max
CP
= 0V


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