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LM2574 Datasheet(PDF) 2 Page - ON Semiconductor

Part No. LM2574
Description  0.5 A, Adjustable Output Voltage, Step−Down Switching Regulator
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Maker  ONSEMI [ON Semiconductor]
Homepage  http://www.onsemi.com
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LM2574 Datasheet(HTML) 2 Page - ON Semiconductor

 
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LM2574, NCV2574
http://onsemi.com
2
Figure 1. Block Diagram and Typical Application
7.0 − 40 V
Unregulated
DC Input
L1
330
mH
Pwr
Gnd
+Vin
5
Cin
22
mF
4ON/OFF
3
Output
7
Feedback
1
D1
1N5819
Cout
220
mF
Typical Application (Fixed Output Voltage Versions)
Representative Block Diagram and Typical Application
Unregulated
DC Input
+Vin
5
Cout
Feedback
1
Cin
L1
D1
R2
R1
1.0 k
Output
7
Pwr Gnd
4
ON/OFF
3
Reset
Latch
Thermal
Shutdown
52 kHz
Oscillator
1.235 V
Band−Gap
Reference
Freq
Shift
18 kHz
Comparator
Fixed Gain
Error Amplifier
Current
Limit
Driver
1.0 Amp
Switch
ON/OFF
3.1 V Internal
Regulator
Vout
Load
Output
Voltage Versions
3.3 V
5.0 V
12 V
15 V
R2
(
W)
1.7 k
3.1 k
8.84 k
11.3 k
For adjustable version
R1 = open, R2 = 0
W
LM2574
5.0 V Regulated
Output 0.5 A Load
Sig
Gnd
2
Sig Gnd
2
(12)
(14)
(3)
(4)
(6)
(5)
(5)
(12)
(3)
(4)
(14)
(6)
NOTE: Pin numbers in ( ) are for the SO−16W package.
ABSOLUTE MAXIMUM RATINGS (Absolute Maximum Ratings indicate limits beyond which damage to the device may occur).
Rating
Symbol
Value
Unit
Maximum Supply Voltage
Vin
45
V
ON/OFF Pin Input Voltage
−0.3 V
≤ V ≤ +Vin
V
Output Voltage to Ground (Steady State)
−1.0
V
DW Suffix, Plastic Package Case 751G
Max Power Dissipation
PD
Internally Limited
W
Thermal Resistance, Junction−to−Air
RqJA
145
°C/W
N Suffix, Plastic Package Case 626
Max Power Dissipation
PD
Internally Limited
W
Thermal Resistance, Junction−to−Ambient
RqJA
100
°C/W
Thermal Resistance, Junction−to−Case
RqJC
5.0
°C/W
Storage Temperature Range
Tstg
−65
°C to +150°C
°C
Minimum ESD Rating
2.0
kV
(Human Body Model: C = 100 pF, R = 1.5 k
W)
Lead Temperature (Soldering, 10 seconds)
260
°C
Maximum Junction Temperature
TJ
150
°C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
NOTE: ESD data available upon request.


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