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PI74LPT244Q Datasheet(PDF) 4 Page - Pericom Semiconductor Corporation |
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PI74LPT244Q Datasheet(HTML) 4 Page - Pericom Semiconductor Corporation |
4 / 8 page PI74LPT244 3.3V 8-Bit Buffer /Line Driver 4 PS2058F 06/05/06 Power Supply Characteristics Parameters Description Test Conditions(1) Min. Typ(2) Max. Units ICC Quiescent Power Supply Current VCC = Max. VIN = GND or VCC 0.1 10 µA ΔICC Quiescent Power Supply Current TTL Inputs HIGH VCC = Max. VIN = VCC – 0.6V(3) 500 µA ICCD Dynamic Power Supply(4) VCC = Max., Outputs Open OEX = GND One Bit Toggling 50% Duty Cycle VIN = VCC VIN = GND 50 75 µA/ MHz IC Total Power Supply Current(6) VCC = Max., Outputs Open fI = 10 MHZ 50% Duty Cycle OEX = GND One Bit Toggling VIN = VCC – 0.6V VIN = GND 0.6 2.3 mA VCC = Max., Outputs Open fI = 2.5 MHZ 50% Duty Cycle OEX = GND 8 Bits Toggling VIN = VCC – 0.6V VIN = GND 2.1 4.7(5) mA Notes: 1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device. 2. Typical values are at Vcc = 3.3V, +25°C ambient. 3. Per TTL driven input; all other inputs at Vcc or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of the Icc formula. These limits are guaranteed but not tested. 6. IC =IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ΔICC DHNT + ICCD (fCP/2 + fINI) ICC = Quiescent Current (ICCL, ICCH and ICCZ) ΔICC = Power Supply Current for a TTL High Input DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL) fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices) NCP = Number of Clock Inputs at fCP fI = Input Frequency NI = Number of Inputs at fI All currents are in milliamps and all frequencies are in megahertz. Capacitance (TA = 25°C, f = 1 MHz) Parameters(1) Description Test Conditions Typ Max. Units CIN Input Capacitance VIN = 0V 4.5 6 pF COUT Output Capacitance VOUT = 0V 5.5 8 Notes: 1. This parameter is determined by device characterization but is not production tested. 06-0181 |
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