SN54LVT8980, SN74LVT8980

EMBEDDED TEST BUS CONTROLLERS

IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 8BIT GENERIC HOST INTERFACES

SCBS676E − DECEMBER 1996 − REVISED MARCH 2004

1

POST OFFICE BOX 655303

Family of Testability Products Supporting

IEEE Std 1149.1-1990 (JTAG) Test Access

Port (TAP) and Boundary-Scan Architecture

Scan-Accessible Test/Maintenance

Facilities at Board and System Levels

Fully 5-V Tolerant for Mastering Both 5-V

and/or 3.3-V IEEE Std 1149.1 Targets

Microprocessors/Microcontrollers Via 8-Bit

Asynchronous Read/Write Data Bus

Command Set and Smart TAP Control

Support Multidrop TAP Configurations

Using TI’s Addressable Scan Port

Programmable Division, Gated-TCK, and

Free-Running-TCK Modes

Arbitrary TMS/TDI Sequences for

Noncompliant Targets

Allows Virtually Unlimited Scan/Test Length

Delays of Up To 15 TCK Cycles

External Control of TAP Signals

at TAP Support Backplane Interface and/or

High Fanout

Small-Outline (DW) Package, Ceramic Chip

Carriers (FK), and Ceramic 300-mil DIPs (JT)

description

The ’LVT8980 embedded test-bus controllers (eTBC) are members of the TI broad family of testability integrated

circuits. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex

circuit assemblies. Unlike most other devices of this family, the eTBC is not a boundary-scannable device;

rather, its function is to master an IEEE Std 1149.1 (JTAG) test access port (TAP) under the command of an

embedded host microprocessor/microcontroller. Thus, the eTBC enables the practical and effective use of the

IEEE

Std

1149.1

test-access

infrastructure

to

support

embedded/built-in

test,

emulation,

and

configuration/maintenance facilities at board and system levels.

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SN54LVT8980 ...JT PACKAGE

SN74LVT8980 . . . DW PACKAGE

(TOP VIEW)

5

6

7

8

9

10

11

25

24

23

22

21

20

19

4

3

2

128

RDY

TDO

NC

TCK

TMS

TRST

D1

D2

D3

NC

GND

D4

D5

SN54LVT8980 . . . FK PACKAGE

(TOP VIEW)

27 26

STRB

R/W

D0

D1

D2

D3

GND

D4

D5

D6

D7

CLKIN

A0

A1

A2

RDY

TDO

TCK

TMS

TRST

TDI

RST

TOE

1

2

3

4

5

6

7

8

9

10

11

12

24

23

22

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19

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16

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14

13

NC − No internal connection

Copyright

 2004, Texas Instruments Incorporated

UNLESS OTHERWISE NOTED this document contains PRODUCTION

DATA information current as of publication date. Products conform to

specifications per the terms of Texas Instruments standard warranty.

Production processing does not necessarily include testing of all

parameters.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.