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TL1454ACD Datasheet(PDF) 8 Page - Texas Instruments |
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TL1454ACD Datasheet(HTML) 8 Page - Texas Instruments |
8 / 27 page TL1454A, TL1454AY DUAL-CHANNEL PULSE-WIDTH-MODULATION (PWM) CONTROL CIRCUIT SLVS423 A– MAY 2002 – REVISED SEPTEMBER 2002 8 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 recommended operating conditions MIN MAX UNIT Supply voltage, VCC 3.6 20 V Error amplifier common-mode input voltage – 0.2 1.45 V Output voltage, VO 20 V Output current, IO ±40 mA COMP source current – 45 µA COMP sink current 100 µA Reference output current 1 mA COMP dc load resistance 100 k Ω Timing capacitor, CT 10 4000 pF Timing resistor, RT 5.1 100 k Ω Oscillator frequency 50 2000 kHz Operating free-air temperature, TA TL1454AC – 20 85 °C electrical characteristics over recommended operating free-air temperature range, VCC = 6 V, fosc = 500 kHz (unless otherwise noted) reference PARAMETER TEST CONDITIONS TL1454A UNIT PARAMETER TEST CONDITIONS MIN TYP MAX UNIT V Output voltage REF IO = 1 mA, TA = 25°C 1.22 1.26 1.32 V Vref Output voltage, REF IO = 1 mA 1.20 1.34 V Input regulation VOC = 3.6 V to 20 V, IO = 1 mA 2 6 mV Output regulation IO = 0.1 mA to 1 mA 1 7.5 mV Output voltage change with temperature TA = TA(min) to 25°C, IO = 1 mA –12.5 – 1.25 12.5 mV Output voltage change with temperature TA = 25°C to 85°C, IO = 1 mA –12.5 –2.5 12.5 mV IOS Short-circuit output current Vref = 0 V 30 mA undervoltage lockout (UVLO) PARAMETER TEST CONDITIONS TL1454A UNIT PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIT + Positive-going threshold voltage 2.9 V VIT – Negative-going threshold voltage TA = 25°C 2.7 V Vhys Hysteresis, VIT + – VIT – TA 25 C 100 200 mV short-circuit protection (SCP) PARAMETER TEST CONDITIONS TL1454A UNIT PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIT Input threshold voltage TA = 25°C 0.93 1 1.07 V Vstby† Standby voltage No pullup 140 185 230 mV VI(latched) Latched-mode input voltage No pullup 60 120 mV VIT(COMP) Comparator threshold voltage COMP1, COMP2 1 V Input source current TA = 25°C, VO(SCP) = 0 – 5 – 15 – 20 µA † This symbol is not presently listed within EIA / JEDEC standards for semiconductor symbology. |
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