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SN65C3223E Datasheet(PDF) 5 Page - Texas Instruments

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Part No. SN65C3223E
Description  3-V TO 5.5-V MULTICHANNEL RS-232 LINE DRIVERS/RECEIVERS WITH ±15-kV ESD PROTECTION
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Maker  TI [Texas Instruments]
Homepage  http://www.ti.com
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SN65C3223E Datasheet(HTML) 5 Page - Texas Instruments

 
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DRIVER SECTION
Electrical Characteristics
(1)
Switching Characteristics
(1)
SN65C3223E
,, SN75C3223E
3-V TO 5.5-V MULTICHANNEL RS-232 LINE DRIVERS/RECEIVERS
WITH
±15-kV ESD PROTECTION
SLLS727A – MAY 2006 – REVISED JULY 2006
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 5)
PARAMETER
TEST CONDITIONS
MIN
TYP(2)
MAX
UNIT
VOH
High-level output voltage
DOUT at RL = 3 kΩ to GND
5
5.4
V
VOL
Low-level output voltage
DOUT at RL = 3 kΩ to GND
–5
–5.4
V
IIH
High-level input current
VI = VCC
±0.01
±1
µA
IIL
Low-level input current
VI at GND
±0.01
±1
µA
VCC = 3.6 V, VO = 0 V
IOS
Short-circuit output current(3)
±35
±60
mA
VCC = 5.5 V, VO = 0 V
ro
Output resistance
VCC, V+, and V– = 0 V, VO = ±2 V
300
10M
FORCEOFF = GND, VCC = 3 V to 3.6 V, VO = ±12 V
±25
IOZ
Output leakage current
µA
FORCEOFF = GND, VCC = 4.5 V to 5.5 V, VO = ±12 V
±25
(1)
Test conditions are C1–C4 = 0.1
µF at V
CC = 3.3 V ± 0.3 V; C1 = 0.047 µF, C2–C4 = 0.33 µF at VCC = 5 V ± 0.5 V.
(2)
All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.
(3)
Short-circuit durations should be controlled to prevent exceeding the device absolute power dissipation ratings, and not more than one
output should be shorted at a time.
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 5)
PARAMETER
TEST CONDITIONS
MIN TYP(2)
MAX
UNIT
CL = 1000 pF
250
Maximum
RL = 3 kΩ,
data rate
CL = 250 pF,
VCC = 3 V to 4.5 V
1000
kbit/s
One DOUT switching
(see Figure 1)
CL = 1000 pF,
VCC = 4.5 V to 5.5 V
1000
tsk(p)
Pulse skew(3)
CL = 150 pF to 2500 pF,
RL = 3 kΩ to 7 kΩ,
See Figure 2
300
ns
RL = 7 kΩ,
CL = 150 pF to 1000 pF
8
90
Slew rate,
SR(tr)
transition region
CL = 1000 pF
12
60
V/
µs
RL = 3 kΩ
(see Figure 1)
CL = 150 pF to 250 pF
24
150
(1)
Test conditions are C1–C4 = 0.1
µF at V
CC = 3.3 V ± 0.3 V; C1 = 0.047 µF, C2–C4 = 0.33 µF at VCC = 5 V ± 0.5 V.
(2)
All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.
(3)
Pulse skew is defined as |tPLH – tPHL| of each channel of the same device.
5
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