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MNLM185B-X Datasheet(PDF) 1 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. MNLM185B-X
Description  MICROCIRCUIT DATA SHEET
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
Logo NSC - National Semiconductor (TI)

MNLM185B-X Datasheet(HTML) 1 Page - National Semiconductor (TI)

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Original Creation Date: 08/15/95
Last Update Date: 02/25/03
Last Major Revision Date: 08/15/95
MNLM185B-X REV 0B0
MICROCIRCUIT DATA SHEET
ADJUSTABLE MICROPOWER VOLTAGE REFERENCE
General Description
The LM185B is a micropower 3-terminal adjustable band-gap voltage reference diode.
Operating from 1.24 to 5.3V and over a 10 uA to 20 mA current range, it features
exceptionally low dynamic impedance and good temperature stability. On-chip trimming is
used to provide tight voltage tolerance. Since the LM185B band-gap reference uses only
transistors and resistors, low noise and good long-term stability result.
Careful design of the LM185B has made the device tolerant of capacitive loading, making it
easy to use in almost any reference application. The wide dynamic operating range allows
its use with widely varying supplies with excellent regulation.
The extremely low power drain of the LM185B makes it useful for micropower circuitry. This
voltage reference can be used to make portable meters, regulators or general purpose
analog circuitry with battery life approaching shelf life. Further, the wide operating
current allows it to replace older references with a tighter tolerance part.
NS Part Numbers
LM185BE/883
LM185BH/883
Industry Part Number
LM185B
Prime Die
LM185
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1


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