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IDT74FCT244D Datasheet(PDF) 2 Page - Integrated Device Technology |
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IDT74FCT244D Datasheet(HTML) 2 Page - Integrated Device Technology |
2 / 6 page 2 MILITARYANDCOMMERCIALTEMPERATURERANGES IDT54/74FCT244/A/C FASTCMOSOCTALBUFFER/LINEDRIVER 2 3 1 16 15 14 11 19 18 20 17 13 12 5 6 7 4 D20-1 SO20-2 E20-1 8 9 10 OEA DA1 DA0 OB0 VCC OB1 DA3 DA2 OB2 OB3 GND OEB OA1 OA0 DB0 DB1 OA3 OA2 DB2 DB3 1 2 3 4 5 7 9 6 8 10 11 12 13 14 15 16 17 18 19 20 L20-2 OA1 DB0 DB1 OA2 OA0 INDEX DA1 OB1 DA3 DA2 OB2 DIP/ SOIC/ CERPACK TOP VIEW LCC TOP VIEW 1998 Integrated Device Technology, Inc. DSC-123456 c PIN CONFIGURATION FUNCTION TABLE (1) Inputs OEA OEB D Outputs LLL L LL H H HH X Z NOTE: 1. H = High Voltage Level X = Don't Care L = Low Voltage Level Z = HIGH Impedance PIN DESCRIPTION Pin Names Description OEA, OEB 3–State Output Enable Inputs (Active LOW) Dxx Inputs Oxx Outputs ABSOLUTE MAXIMUM RATINGS(1) Symbol Rating Commercial Military Unit VTERM(2) Terminal Voltage with Respect to GND –0.5 to +7 –0.5 to +7 V VTERM(3) Terminal Voltage with Respect to GND –0.5 to VCC –0.5 to VCC V TA Operating Temperature 0 to +70 –55 to +125 °C TBIAS Temperature Under Bias –55 to +125 –65 to +135 °C TSTG Storage Temperature –55 to +125 –65 to +150 °C PT Power Dissipation 0.5 0.5 W IOUT DC Output Current 120 120 mA 8-link NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed VCC by +.5V unless otherwise noted. 2. Input and VCC terminals only. 3. Outputs and I/O terminals only. CAPACITANCE (TA = +25OC, f = 1.0MHz) Symbol Parameter(1) Conditions Typ. Max. Unit CIN Input Capacitance VIN = 0V 6 10 pF COUT Output Capacitance VOUT = 0V 8 12 pF 8-link NOTE: 1. This parameter is measured at characterization but not tested. |
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