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NE56632-XX Datasheet(PDF) 5 Page - NXP Semiconductors

Part No. NE56632-XX
Description  Active-LOW system reset with adjustable delay time
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Maker  PHILIPS [NXP Semiconductors]
Homepage  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

NE56632-XX Datasheet(HTML) 5 Page - NXP Semiconductors

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Philips Semiconductors
Product data
NE56632-XX
Active-LOW system reset with adjustable delay time
2002 Mar 25
5
TYPICAL PERFORMANCE CURVES, NE56632-20
SL01620
AMBIENT TEMPERATURE, Tamb (°C)
1.9850
1.9875
1.9900
1.9925
1.9950
1.9975
2.0000
2.0025
2.0050
–40
–20
0
20
40
60
80
100
Test Circuit 1
VCC = HIGH-to-LOW
RL = 4.7 kΩ
VOL ≤ 0.4 V
S1 = ON
Figure 3. Detection threshold versus temperature.
SL01621
AMBIENT TEMPERATURE, Tamb (°C)
30
40
50
60
70
80
90
100
–40
–20
0
20
40
60
80
100
Test Circuit 1
VCC = LOW-to-HIGH-to-LOW
RL = 4.7 kΩ
S1 = ON
Figure 4. Hysteresis voltage versus temperature.
SL01622
AMBIENT TEMPERATURE, Tamb (°C)
–40
–20
0
20
40
60
80
100
0.185
0.190
0.195
0.200
0.205
0.210
0.215
0.220
0.225
Test Circuit 1
VCC1 = VS(min) – 0.05 V
RL = 4.7 kΩ
S1 = ON
Figure 5. LOW-level output voltage versus temperature.
SL01623
AMBIENT TEMPERATURE, Tamb (°C)
–40
–20
0
20
40
60
80
100
3
4
5
6
7
8
9
Test Circuit 1
VCC1 = VS(min) – 0.05 V
RL = ∞
Figure 6. Supply current (ON time) versus temperature.
SL01624
AMBIENT TEMPERATURE, Tamb (°C)
–40
–20
0
20
40
60
80
100
2.0
2.5
3.0
3.5
4.0
4.5
Test Circuit 1
RL = ∞
VCC1 = VS(typ)/0.85
Figure 7. Supply current (OFF time) versus temperature.
SL01625
AMBIENT TEMPERATURE, Tamb (°C)
–40
–20
0
20
40
60
80
100
0.3
0.4
0.5
0.6
0.7
0.8
0.9
Test Circuit 1
RL = 4.7 kΩ
VOL ≤ 0.4 V
S1 = ON
Figure 8. Min. operating threshold voltage versus temperature.


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