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LM50B Datasheet(PDF) 2 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. LM50B
Description  SOT-23 Single-Supply Centigrade Temperature Sensor
Download  8 Pages
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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LM50B Datasheet(HTML) 2 Page - National Semiconductor (TI)

   
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Absolute Maximum Ratings (Note 1)
Supply Voltage
a
12V to b02V
Output Voltage
(aVS a 06V) to b10V
Output Current
10 mA
Storage Temperature
b
65 Cto a150 C
Lead Temperature
SOT Package (Note 2)
Vapor Phase (60 seconds)
215 C
Infrared (15 seconds)
220 C
TJMAX Maximum Junction Temperature
150 C
ESD Susceptibility (Note 3)
Human Body Model
2000V
Machine Model
200V
Operating Ratings (Note 1)
Specified Temperature Range
TMIN to TMAX
LM50C
b
40 Cto a125 C
LM50B
b
25 Cto a100 C
Operating Temperature Range
b
40 Cto a150 C
iJA (Note 4)
450 CW
Supply Voltage Range (aVS)
a
45V to a10V
Electrical Characteristics Unless otherwise noted these specifications apply for VS ea5VDC and ILOAD e
a
05 mA in the circuit of
Figure 1 Boldface limits apply for the specified TA e TJ e TMIN to TMAX all other limits TA
e
TJ ea25 C unless otherwise noted
Parameter
Conditions
LM50B
LM50C
(Limit)
Units
Typical
Limit
Typical
Limit
(Note 5)
(Note 5)
Accuracy
TA ea25 C
g
20
g
30
C (max)
(Note 6)
TA e TMAX
g
30
g
40
C (max)
TA e TMIN
a
30 b35
g
40
C (max)
Nonlinearity (Note 7)
g
08
g
08
C (max)
Sensor Gain
a
97
a
97
mV C (min)
(Average Slope)
a
103
a
103
mV C (max)
Output Resistance
2000
4000
2000
4000
X
(max)
Line Regulation
a
45V s VS s a10V
g
08
g
08
mVV (max)
(Note 8)
g
12
g
12
mVV (max)
Quiescent Current
a
45V s VS s a10V
130
130
m
A (max)
(Note 9)
180
180
m
A (max)
Change of Quiescent
a
45V s VS s a10V
20
20
m
A (max)
Current (Note 8)
Temperature Coefficient of
a
10
a
20
m
A C
Quiescent Current
Long Term Stability (Note 10)
TJ e 125 C for
g
008
g
008
C
1000 hours
Note 1
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur DC and AC electrical specifications do not apply when operating
the device beyond its rated operating conditions
Note 2
See AN-450 ‘‘Surface Mounting Methods and Their Effect on Product Reliability’’ or the section titled ‘‘Surface Mount’’ found in a current National
Semiconductor Linear Data Book for other methods of soldering surface mount devices
Note 3
Human body model 100 pF discharged through a 15 kX resistor Machine model 200 pF discharged directly into each pin
Note 4
Thermal resistance of the SOT-23 package is specified without a heat sink junction to ambient
Note 5
Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level)
Note 6
Accuracy is defined as the error between the output voltage and 10mv C times the device’s case temperature at specified conditions of voltage current
and temperature (expressed in C)
Note 7
Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the device’s rated temperature
range
Note 8
Regulation is measured at constant junction temperature using pulse testing with a low duty cycle Changes in output due to heating effects can be
computed by multiplying the internal dissipation by the thermal resistance
Note 9
Quiescent current is defined in the circuit of
Figure 1
Note 10
For best long-term stability any precision circuit will give best results if the unit is aged at a warm temperature andor temperature cycled for at least 46
hours before long-term life test begins This is especially true when a small (Surface-Mount) part is wave-soldered allow time for stress relaxation to occur The
majority of the drift will occur in the first 1000 hours at elevated temperatures The drift after 1000 hours will not continue at the first 1000 hour rate
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