NB2869ASNR2 datasheet(5/8 Pages) ONSEMI

Part #	NB2869ASNR2

Description	Low Power, Reduced EMI Clock Synthesizer

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Manufacturer	ONSEMI [ON Semiconductor]

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NB2869A

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Table 6. DC ELECTRICAL CHARACTERISTICS FOR 3.3 V SUPPLY (Test Conditions: All parameters are measured at room

temperature 25°C)

Symbol

Description

Min

Typ

Max

Unit

VIL

Input LOW Voltage

GND − 0.3

0.8

V

VIH

Input HIGH Voltage

2.0

VDD + 0.3

V

IIL

Input LOW Current

−35

mA

IIH

Input HIGH Current

35

mA

IXOL

XOUT Output LOW Current (@ 0.4 V, VDD = 3.3 V)

3.0

mA

IXOH

XOUT Output HIGH Current (@ 2.5 V, VDD = 3.3 V)

3.0

mA

VOL

Output LOW Voltage (VDD = 3.3 V, IOL = 8.0 mA)

0.4

V

VOH

Output HIGH Voltage (VDD = 3.3 V, IOH = 8.0 mA)

2.5

V

IDD

Static Supply Current (Note 4)

1.3

mA

ICC

Dynamic Supply Current (3.3 V, 10 MHz, and No Load)

4.0

mA

VDD

Operating Voltage

2.7

3.3

3.6

V

tON

Powerup Time (first locked cycle after powerup) (Note 5)

5.0

mS

ZOUT

Clock Output Impedance

45

W

NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit

board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared

operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit

values are applied individually under normal operating conditions and not valid simultaneously.

4. XIN/CLKIN pin is pulled low.

5. VDD and XIN/CLKIN input are stable.

Table 7. AC ELECTRICAL CHARACTERISTICS FOR 3.3 V SUPPLY

Symbol

Description

Min

Typ

Max

Unit

CLKIN

Input Frequency

6.0

13

MHz

ModOUT

Output Frequency

6.0

13

MHz

fd

Frequency Deviation

Input Frequency = 6.0 MHz

Input Frequency = 13 MHz

±1.6

±0.77

%

tLH (Note 6)

Output Rise Time (measured at 0.8 V to 2.0 V)

0.5

1.4

1.6

ns

tHL (Note 6)

Output Fall Time (measured at 2.0 V to 0.8 V)

0.4

1.0

1.2

ns

tJC

Jitter (Cycle−to−Cycle)

200

ps

tD

Output Duty Cycle

45

50

55

%

NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit

board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared

operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit

values are applied individually under normal operating conditions and not valid simultaneously.

6. tLH and tHL are measured at capacitive load of 15 pF.

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