NB4L858M

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4

Table 3. Table 3. ATTRIBUTES

Characteristics

Value

ESD Protection

Human Body Model

Machine Model

> 2000 V

>110 V

Moisture Sensitivity (Note 1)

32−LQFP

Level 2

Flammability Rating

Oxygen Index: 28 to 34

UL 94 V−0 @ 0.125 in

Transistor Count

380

Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test

1. For additional information, see Application Note AND8003/D.

Table 4. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

Positive Power Supply

GND = 0 V

3.8

V

Positive Input

GND = 0 V

GND

3.8

V

Differential Input Voltage

|D − D|

3.8

V

Resistor)

Static

Surge

45

80

mA

mA

Output Current

Continuous

Surge

25

80

mA

mA

Operating Temperature Range

LQFP−32

−40 to +85

°C

Storage Temperature Range

−65 to +150

°C

Thermal Resistance (Junction−to−Ambient)

0 LFPM

500 LFPM

32 LQFP

32 LQFP

80

55

°C/W

°C/W

Thermal Resistance (Junction−to−Case)

2S2P (Note 2)

32 LQFP

12 to 17

°C/W

Wave Solder

Pb−Free

<3 sec @ 260

°C

265

°C

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit

values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,

damage may occur and reliability may be affected.

2. JEDEC standard 51−6, multilayer board − 2S2P (2 signal, 2 power).