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NB4L16M Datasheet(PDF) 3 Page - ON Semiconductor |
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NB4L16M Datasheet(HTML) 3 Page - ON Semiconductor |
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NB4L16M http://onsemi.com 3 Table 2. ATTRIBUTES Characteristics Value Input Default State Resistors R1 R2 37.5 kW 73 kW ESD Protection Human Body Model Machine Model Charged Device Model > 2 kV > 200 V > 1 kV Moisture Sensitivity (Note 2) Pb Pkg Pb−Free Pkg QFN−16 Level 1 Level 1 Flammability Rating Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in Transistor Count 157 Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test 2. For additional information, see Application Note AND8003/D. Table 3. MAXIMUM RATINGS Symbol Parameter Condition 1 Condition 2 Rating Unit VCC Positive Power Supply VEE = 0 V 6 V VEE Negative Power Supply VCC = 0 V −6 V VI Positive Input Negative Input VEE = 0 V VCC = 0 V VI = VCC VI = VEE 6 −6 V V VINPP Differential Input Voltage |D − D| |VCC − VEE| V IIN Input Current Through RT (50 W Resistor) Static Surge 45 80 mA mA IOUT Output Current Continuous Surge 25 50 mA mA IBB VBB Sink/Source ± 0.5 mA TA Operating Temperature Range −40 to +85 °C Tstg Storage Temperature Range −65 to +150 °C qJA Thermal Resistance (Junction−to−Ambient) (Note 3) 0 lfpm 500 lfpm QFN−16 QFN−16 42 35 °C/W °C/W qJC Thermal Resistance (Junction−to−Case) 1S2P (Note 3) QFN−16 4 °C/W Tsol Wave Solder Pb Pb−Free 265 265 °C Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected. 3. JEDEC standard multilayer board − 1S2P (1 signal, 2 power) with 8 filled thermal vias under exposed pad. |
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