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SN74SSTU32864C Datasheet(PDF) 1 Page - Texas Instruments

Part No. SN74SSTU32864C
Description  25-BIT CONFIGURABLE REGISTERED BUFFER WITH SSTL 18 INPUTS AND OUTPUTS
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Maker  TI [Texas Instruments]
Homepage  http://www.ti.com
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SN74SSTU32864C Datasheet(HTML) 1 Page - Texas Instruments

 
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FEATURES
DESCRIPTION/ORDERING INFORMATION
SN74SSTU32864C
25-BIT CONFIGURABLE REGISTERED BUFFER
WITH SSTL_18 INPUTS AND OUTPUTS
SCES542A – JANUARY 2004 – REVISED FEBRUARY 2005
Differential Clock (CLK and CLK) Inputs
Member of the Texas Instruments Widebus+™
Supports LVCMOS Switching Levels on
Family
Control and RESET Inputs
Pinout Optimizes DDR2 DIMM PCB Layout
RESET Input Disables Differential Input
Receivers, Resets All Registers, and Forces
Configurable as 25-Bit 1:1 or 14-Bit 1:2
All Outputs Low
Registered Buffer
Latch-Up Performance Exceeds 100 mA Per
Chip-Select Inputs Gate Data Outputs From
JESD 78, Class II
Changing State and Minimize System Power
Consumption
ESD Protection Exceeds JESD 22
Output Edge-Control Circuitry Minimizes
– 2000-V Human-Body Model (A114-A)
Switching Noise in Unterminated Line
– 200-V Machine Model (A115-A)
Supports SSTL_18 Data Inputs
– 1000-V Charged-Device Model (C101)
This 25-bit 1:1 or 14-bit 1:2 configurable registered buffer is designed for 1.7-V to 1.9-V VCC operation. In the 1:1
pinout configuration, only one device per DIMM is required to drive nine SDRAM loads. In the 1:2 pinout
configuration, two devices per DIMM are required to drive 18 SDRAM loads.
All inputs are SSTL_18, except the LVCMOS reset (RESET) and LVCMOS control (Cn) inputs. All outputs are
edge-controlled circuits optimized for unterminated DIMM loads and meet SSTL_18 specifications.
The SN74SSTU32864C operates from a differential clock (CLK and CLK). Data are registered at the crossing of
CLK going high and CLK going low.
The C0 input controls the pinout configuration of the 1:2 pinout from register-A configuration (when low) to
register-B configuration (when high). The C1 input controls the pinout configuration from 25-bit 1:1 (when low) to
14-bit 1:2 (when high). C0 and C1 should not be switched during normal operation. They should be hard-wired to
a valid low or high level to configure the register in the desired mode. In the 25-bit 1:1 pinout configuration, the
A6, D6, and H6 terminals are driven low and should not be used.
In the DDR2 RDIMM application, RESET is specified to be completely asynchronous with respect to CLK and
CLK. Therefore, no timing relationship can be ensured between the two. When entering reset, the register is
cleared and the data outputs are driven low quickly, relative to the time to disable the differential input receivers.
However, when coming out of reset, the register becomes active quickly, relative to the time required to enable
the differential input receivers. As long as the data inputs are low, and the clock is stable during the time from the
low-to-high transition of RESET until the input receivers are fully enabled, the design of the SN74SSTU32864C
must ensure that the outputs remain low, thus ensuring no glitches on the output.
To ensure defined outputs from the register before a stable clock has been supplied, RESET must be held in the
low state during power up.
ORDERING INFORMATION
TA
PACKAGE(1)
ORDERABLE PART NUMBER
TOP-SIDE MARKING
LFBGA – GKE
Tape and reel
SN74SSTU32864CGKER
S864C
0
°C to 70°C
LFBGA – ZKE
Tape and reel
SN74SSTU32864CZKER
S864C
(1)
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus+ is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 2004–2005, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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