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SN74SSTE32882 Datasheet(PDF) 1 Page - Texas Instruments

Part No. SN74SSTE32882
Description  28-Bit to 56-Bit Registered Buffer With Address Parity Test and One Pair to Four Pair Differential Clock PLL Driver
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

SN74SSTE32882 Datasheet(HTML) 1 Page - Texas Instruments

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28-Bit to 56-Bit Registered Buffer With Address Parity Test and One Pair to Four Pair
Differential Clock PLL Driver
1.5-V Phase Lock Loop Clock Driver for
Buffering One Differential Clock Pair (CK and
Pinout Optimizes DDR3 DIMM PCB Layout
CK) and Distributing to Four Differential
1-to-2 Register Outputs and 1-to-4 Clock Pair
Outputs Support Stacked DDR3 DIMMs
Supports LVCMOS Levels on RESET Input
Chip-Select Inputs Gate the Data Outputs
RESET Input Disables Differential Input
from Changing State and Minimizes System
Receivers, Resets All Registers, and Forces
Power Consumption
All Outputs Low, Except QERR
Supports SSTL_15 Data Inputs
Checks Parity on Command and Address
(CS-gated) Data Inputs
This 28-bit 1:2 configurable registered buffer is designed for 1.425-V to 1.575-V VCC operation. One device per
DIMM is required to drive up to 36 SDRAM loads (maximum 2 Ranks
× 4).
The SN74SSTE32882 includes a high-performance, low-jitter, low-skew PLL based clock buffer that distributes a
differential input clock signal (CK and CK) to four differential pairs of clock outputs (QCKn and QCKn) and to
one differential pair of feedback clock outputs (FBOUT and FBOUT). The clock outputs are controlled by the
input clocks (CK and CK), the feedback clocks (FBIN and FBIN) and the analog power inputs (AVDD and AVSS).
The SN74SSTE32882 is able to track spread spectrum clocking (SSC) for reduced EMI.
All device inputs are SSTL_15, except reset (RESET), which is LVCMOS. All outputs are edge-controlled circuits
optimized for terminated DIMM loads, and meet SSTL_15 specifications at the DRAM inputs, except the
open-drain error (QERR) output. The clock outputs (Yn, Yn) and control outputs (QACSn, QBCSn, QACKEn,
QBCKEn, QAODTn and QBODTn) are designed with different drive strengths, from the other data Qn outputs,
to adapt to different loading conditions.
The SN74SSTE32882 operates from the differential clock (CK and CK). Data are registered at the crossing of
CK going high and CK going low.
The SN74SSTE32882 accepts a parity bit from the memory controller on the parity bit (PAR_IN) input and
compares it with the data received on the DCSn gated D-inputs (DA0..DA15, DBA0..DBA2, DRAS, DCAS, DWE)
during the previous clock cycle. The convention is even parity, i.e., valid parity is defined as an even number of
ones across the DCSn gated D-inputs combined with the parity input bit. For correct operation, all DCSn gated
D-inputs must be tied to corresponding outputs of the memory controller used for parity generation. Parity errors
are flagged on the open-drain QERR pin (active low).
Tape and reel
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCT PREVIEW information concerns products in the
Copyright © 2006, Texas Instruments Incorporated
formative or design phase of development. Characteristic data and
other specifications are design goals. Texas Instruments reserves
the right to change or discontinue these products without notice.

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