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ONET1191V

SLLS750A – AUGUST 2006 – REVISED SEPTEMBER 2006

11.3-GBPS DIFFERENTIAL VCSEL DRIVER

•

10-Gigabit Ethernet Optical Transmitters

•

Up to 11.3-Gbps Operation

•

8

× and 10× Fibre Channel Optical

•

Two-Wire Digital Interface

Transmitters

•

Digitally Selectable Modulation Current up to

•

SONET OC-192/SDH STM-64 Optical

40 mA

Transmitters

•

Digitally Selectable Bias Current up to 20 mA

•

XFP and SFP+ Transceiver Modules

•

Automatic Power Control (APC) Loop

•

XENPAK, XPAK, X2, and 300-Pin MSA

•

Supports Transceiver Management System

Transponder Modules

(TMS)

•

Programmable Input Equalizer

•

Includes Laser Safety Features

•

Analog Temperature Sensor Output

•

Single 3.3-V Supply

•

Operating Temperature –40

°C to 85°C

•

Surface-Mount, Small-Footprint, 4-mm

×

4-mm, 20-Pin QFN Package

The ONET1191V is a high-speed, 3.3-V laser driver designed to directly modulate VCSELs at data rates up to

11.3 Gbps.

The device provides a two-wire serial interface which allows digital control of the modulation and bias currents,

eliminating the need for external components. An optional input equalizer can be used for equalization of up to

300 mm (12 inches) of microstrip or stripline transmission line on FR4 printed-circuit boards.

The ONET1191V includes an integrated automatic power control (APC) loop as well as circuitry to support laser

safety and transceiver management systems.

The VCSEL driver is characterized for operation from –40

°C to 85°C ambient temperatures and is available in a

small-footprint, 4-mm

× 4-mm, 20-pin QFN package.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2006, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.