MAX1186 datasheet(17/21 Pages) MAXIM | Dual 10-Bit, 40Msps, 3V, Low-Power ADC with Internal Reference and Multiplexed Parallel Outputs

Part #	MAX1186

Description	Dual 10-Bit, 40Msps, 3V, Low-Power ADC with Internal Reference and Multiplexed Parallel Outputs

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Manufacturer	MAXIM [Maxim Integrated Products]

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17 / 21 page

Dual 10-Bit, 40Msps, 3V, Low-Power ADC with

Internal Reference and Multiplexed Parallel Outputs

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17

Figure 6. Transformer-Coupled Input Drive

MAX1186

T1

N.C.

VIN

6

1

5

2

4

3

22pF

0.1

µF

0.1

µF

2.2

µF

25

Ω

25

Ω

MINICIRCUITS

TT1–6

T1

N.C.

VIN

6

1

5

2

4

3

22pF

0.1

µF

0.1

µF

2.2

µF

25

Ω

25

Ω

MINICIRCUITS

TT1–6

INA-

INA+

INB-

INB+

COM

Static Parameter Definitions

Integral Nonlinearity (INL)

Integral nonlinearity is the deviation of the values on an

actual transfer function from a straight line. This straight

line can be either a best straight-line fit or a line drawn

between the endpoints of the transfer function, once

offset and gain errors have been nullified. The static lin-

earity parameters for the MAX1186 are measured using

the best straight-line fit method.

Differential Nonlinearity (DNL)

Differential nonlinearity is the difference between an

actual step width and the ideal value of 1LSB. A DNL

error specification of less than 1LSB guarantees no

missing codes and a monotonic transfer function.

Dynamic Parameter Definitions

Aperture Jitter

Figure 9 depicts the aperture jitter (tAJ), which is the

sample-to-sample variation in the aperture delay.

Aperture Delay

Aperture delay (tAD) is the time defined between the

falling edge of the sampling clock and the instant when

an actual sample is taken (Figure 9).

Signal-to-Noise Ratio (SNR)

For a waveform perfectly reconstructed from digital

samples, the theoretical maximum SNR is the ratio of

the full-scale analog input (RMS value) to the RMS

quantization error (residual error). The ideal, theoretical

minimum analog-to-digital noise is caused by quantiza-

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