MN54ABT646-X REV 0B0

MICROCIRCUIT DATA SHEET

Electrical Characteristics

AC PARAMETERS(Continued)

(The following conditions apply to all the following parameters, unless otherwise specified.)

AC:

CL=50pF RL=500 OHMS TRISE/TFALL = 3.0nS

SYMBOL

PARAMETER

CONDITIONS

NOTES

PIN-

NAME

MIN

MAX

UNIT

SUB-

GROUPS

ts (H/L)

Setup Time HIGH

or LOW

VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C

7

BUS to

Clock

3.0

ns

9

7

BUS to

Clock

3.5

ns

10, 11

th

(H/L)

Hold Time HIGH or

LOW

VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C

7

BUS to

Clock

1.0

ns

9

7

BUS to

Clock

1.0

ns

10, 11

tw

(L)

Pulse Width

VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C

7

CPAB/CP

BA

4.0

ns

9, 10,

11

Fmax

Max Clock

Frequency

VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C

7

CPAB/CP

BA

125

MHz

9, 10,

11

Note 1:

Screen tested 100% on each device at -55C, +25C & +125C Temp., Subgroups 1,2,3,7 & 8.

Note 2:

Screen tested 100% on each device at -55C, +25C, and +125C temp., subgroups A9, A10,

and A11.

Note 3:

Screen tested 100% on each device at +25C temp. only, subgroup A9.

Note 4:

Sample tested (Method 5005, Table 1) on each mfg. lot at +25C, +125C, & -55C temp.

subgroups A1, 2, 3, 7 & 8.

Note 5:

Sample tested (Method 5005, Table 1) on each mfg. Lot at +25C, +125C & -55C temp.,

subgroups A9, 10 & 11.

Note 6:

Sample tested (Method 5005, Table 1) on each mfg. Lot at 25C temp only, subgroup A9.

Note 7:

Not tested (Guaranteed by Design Characterization Data).

Note 8:

Max number of outputs defines as (N).

N-1 data inputs are driven 0V to 3V. one

output @Vol or @Voh.

Note 9:

Max number of data inputs (N) switching.

(N-1) inputs switching 0V to 3V.

Input-under-test switching : 3V to threshold (Vild), 0V to threshold (Vihd), Freq= 1

MHZ

Note 10:

Maximum test duration not to exceed one second, not more than one output shorted at

one time.

7