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BQ24730 Datasheet(PDF) 4 Page - Texas Instruments

Part # BQ24730
Description  ADVANCED MULTI-CHEMISTRY AND MULTI-CELL SYNCHRONOUS SWITCH-MODE CHARGER AND SYSTEM POWER SELECTOR
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

BQ24730 Datasheet(HTML) 4 Page - Texas Instruments

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ABSOLUTE MAXIMUM RATINGS
bq24730
SLUS695 – MARCH 2006
DEVICE INFORMATION (continued)
TERMINAL FUNCTIONS (continued)
TERMINAL
DESCRIPTION
NO.
NAME
Battery to system switch driver output. Gate drive for the battery to system load BAT PMOS power FET to isolate the
system from the battery to prevent current flow from the system to the battery, while allowing a low impedance path
from battery to system and while discharging the battery pack to the system load. Connect this pin directly to the gate
of the input BAT PMOS power FET. Connect the source of the FET to the system load voltage node. Connect the
31
BATDRV
drain of the FET to the battery pack positive node. Placing a 10-k
Ω resistor from the gate to the source of the BAT
FET to keep the FET off when there is no power to the IC is recommended. An optional capacitor is placed from the
gate to the source to slow-down the switching times. The internal gate drive is asymmetrical allowing a quick turn-off
and slower turn-off in addition to the internal break-before-make logic with respect to the ACDRV.
Battery pack cell select logic input. Logic low (LO) input programs 3-cell Li-Ion output voltage (12.6 V). Logic high (HI)
32
CELLS
input programs 4-cell Li-Ion output voltage (16.8 V)
Charger status, open-drain output. Logic low(LO) output indicates charger is on. Logic high (HI) output indicates
33
STAT
controller is not charging. A 10-k
Ω pull-up resistor to the host controller supply rail is needed.
Power ground. Ground connection for the high-current power converter nodes. Only connect to the AGND and GND
34
PGND
nodes by connecting to the PowerPAD™ underneath the IC.
35
LODRV
PWM low side driver output. Connect directly to the gate of the low-side NMOS power FET with a short trace.
Low-side driver gate voltage regulator and source for high-side driver bootstrap voltage. Add a 1-
µF ceramic capacitor
36
REGN
from REGN pin to PGND pin, close to the IC. Place a small signal Schottky diode from REGN to BTST for bootstrap
voltage.
Synchronous buck phase node. Connect directly to the source of the high-side NMOS FET with a short trace. This
37
PH
node is the common connection between the high-side FET, low-side FET, and output inductor. Connect a 0.1-
µF
boot-strap ceramic capacitor from BTST to PH.
38
HIDRV
PWM high side driver output. Connect directly to the gate of the high-side NMOS power FET with a short trace.
High-side FET Boot-strap input pin. Connect to positive side of boot-strap capacitor. Connect a 0.1-
µF bootstrap
capacitor from the BTST pin to the PH node. Also, connect a bootstrap diode with the anode connected to the REGN
39
BTST
pin and the cathode connected to the BTST pin. An optional 4.7-
Ω - 15-Ω series resistor is placed between the BTST
pin and the bootstrap-diode/capacitor junction to slow-down the turn-on time of the high-side FET for reducing ringing
due to high dv/dt of the phase node.
IC power positive supply. Connect directly to the drain of the high-side NMOS power FET. A 0.1-
µF decoupling
40
PVCC
ceramic capacitor is recommended from PVCC to PGND.
over operating free-air temperature range (unless otherwise noted)(1)(2)
PIN
VALUE / UNIT
ACN, ACP, PVCC, ACDRV, SYNN, SYNP, SRP, SRN , BATDRV,
–0.3 V to 30 V
BAT, BYPASS, SYS, VCC
PH
–1 V to 30 V
Supply voltage range
LODRV, REGN, FBO, EAI, EAO, ACGOOD, ISYNSET, CHGEN,
VREF5, ACDET, IBAT, STAT, ACSET, AIRDET, DPMDET,
–0.3 V to 7 V
LBSET, IADSLP, LOWBAT, IADAPT, SRSET, CELLS
BTST, HIDRV (with respect to AGND and PGND)
–1 V to 36 V
Maximum differential voltage
AGND-PGND, AGND-DGND
–0.3 V to 0.3 V
Maximum difference voltage
ACP–ACN , SRP–SRN, and SYNP–SYNN
0.6 V
Operating ambient temperature range (TA)
–40
°C to 85°C
Maximum junction temperature (TJ)
150
°C
Storage temperature range (Tstg)
–65
°C to 150°C
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
All voltages are with respect to AGND, unless otherwise noted. Currents are positive into, negative out of the specified terminal. Consult
Packaging Section of the Data book for thermal limitations and considerations of packages.
4
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