Philips Semiconductors

Product specification

80C528/83C528

CMOS single-chip 8-bit microcontrollers

1995 Feb 02

13

DC ELECTRICAL CHARACTERISTICS (Continued)

TEST

LIMITS

SYMBOL

PARAMETER

PART TYPE

CONDITIONS

MIN

MAX

UNIT

Input leakage current, port 0, EA

±10

µA

Input leakage current, P1.6/SCL, P1.7/SDA

0V<Vi<6.0V

±10

µA

µA

Power supply current:

See notes 6, 7

Active mode

35

mA

Idle mode

6

mA

Power down mode

Power down mode

–40

°C to +125°C

100

150

µA

µA

Internal reset pull-down resistor

50

150

k

Ω

Capacitance of I/O buffer

Freq.=1MHz

10

pF

NOTES:

1. Capacitive loading on Port 0 and Port 2 may cause spurious noise pulses to be superimposed on the LOW level ouput voltage of ALE, Port

1 and Port 3. The noise is due to external bus capacitance discharging into the Port 0 and Port 2 pins when these pins make a 1-to-0

transition during bus operations. In the worst cases (capacitive loading > 100pF), the noise pulse on the ALE line may exceed 0.8V. In such

cases it may be desirable to qualify ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input.

specification when the address bits are stabilizing.

10mA

Port 0:

26mA

Ports 1, 2, & 3:

15mA

71mA

test conditions.

5. Pins of ports 1, 2, and 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches its

35

30

25

20

15

10

5

0

MAX ACTIVE MODE

TYP ACTIVE MODE

MAX IDLE MODE

TYP IDLE MODE

FREQ. AT XTAL1 (MHz)

4

8

12

16

VALID ONLY WITHIN FREQUENCY SPECIFICATIONS OF DEVICE UNDER TEST.