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ADC0838BCV Datasheet(PDF) 6 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # ADC0838BCV
Description  8-Bit Serial I/O A/D Converters with Multiplexer Options
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

ADC0838BCV Datasheet(HTML) 6 Page - National Semiconductor (TI)

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AC Characteristics
The following specifications apply for V
CC = 5V, tr =tf = 20 ns and 25˚C unless otherwise specified.
Typ
Tested
Design
Limit
Parameter
Conditions
(Note 12)
Limit
Limit
Units
(Note 13)
(Note 14)
f
CLK, Clock Frequency
Min
10
kHz
Max
400
kHz
t
C, Conversion Time
Not including MUX Addressing Time
8
1/f
CLK
Clock Duty Cycle
Min
40
%
(Note 10)
Max
60
%
t
SET-UP, CS Falling Edge or
250
ns
Data Input Valid to CLK
Rising Edge
t
HOLD, Data Input Valid
90
ns
after CLK Rising Edge
t
pd1,tpd0 — CLK Falling
C
L=100 pF
Edge to Output Data Valid
Data MSB First
650
1500
ns
(Note 11)
Data LSB First
250
600
ns
t
1H,t0H, — Rising Edge of
C
L=10 pF, RL=10k
125
250
ns
CS to Data Output and
(see TRI-STATE® Test Circuits)
SARS Hi–Z
C
L=100 pf, RL=2k
500
ns
C
IN, Capacitance of Logic
5
pF
Input
C
OUT, Capacitance of Logic
5
pF
Outputs
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating
the device beyond its specified operating conditions.
Note 2: All voltages are measured with respect to the ground plugs.
Note 3: Internal zener diodes (6.3 to 8.5V) are connected from V+ to GND and VCC to GND. The zener at V+ can operate as a shunt regulator and is connected
to VCC via a conventional diode. Since the zener voltage equals the A/D’s breakdown voltage, the diode insures that VCC will be below breakdown when the device
is powered from V+. Functionality is therefore guaranteed for V+ operation even though the resultant voltage at VCC may exceed the specified Absolute Max of 6.5V.
It is recommended that a resistor be used to limit the max current into V+. (See Figure 3 in Functional Description Section 6.0)
Note 4: When the input voltage (VIN) at any pin exceeds the power supply rails (VIN < V
or V
IN > V
+) the absolute value of current at that pin should be limited
to 5 mA or less. The 20 mA package input current limits the number of pins that can exceed the power supply boundaries witha5mA current limit to four.
Note 5: Human body model, 100 pF discharged through a 1.5 k
Ω resistor.
Note 6: Total unadjusted error includes offset, full-scale, linearity, and multiplexer errors.
Note 7: Cannot be tested for ADC0832.
Note 8: For VIN(−)≥VIN(+) the digital output code will be 0000 0000. Two on-chip diodes are tied to each analog input (see Block Diagram) which will forward conduct
for analog input voltages one diode drop below ground or one diode drop greater than the VCC supply. Be careful, during testing at low VCC levels (4.5V), as high
level analog inputs (5V) can cause this input diode to conduct — especially at elevated temperatures, and cause errors for analog inputs near full-scale. The spec
allows 50 mV forward bias of either diode. This means that as long as the analog VIN or VREF does not exceed the supply voltage by more than 50 mV, the output
code will be correct. To achieve an absolute 0 VDC to5VDC input voltage range will therefore require a minimum supply voltage of 4.950 VDC over temperature
variations, initial tolerance and loading.
Note 9: Leakage current is measured with the clock not switching.
Note 10: A 40% to 60% clock duty cycle range insures proper operation at all clock frequencies. In the case that an available clock has a duty cycle outside of these
limits, the minimum, time the clock is high or the minimum time the clock is low must be at least 1 µs. The maximum time the clock can be high is 60 µs. The clock
can be stopped when low so long as the analog input voltage remains stable.
Note 11: Since data, MSB first, is the output of the comparator used in the successive approximation loop, an additional delay is built in (see Block Diagram) to allow
for comparator response time.
Note 12: Typicals are at 25˚C and represent most likely parametric norm.
Note 13: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 14: Guaranteed but not 100% production tested. These limits are not used to calculate outgoing quality levels.
www.national.com
6


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