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74LV74 Datasheet(PDF) 4 Page - NXP Semiconductors

Part No. 74LV74
Description  Dual D-type flip-flop with set and reset; positive-edge trigger
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Manufacturer  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74LV74 Datasheet(HTML) 4 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74LV74
Dual D-type flip-flop with set and reset;
positive edge-trigger
1998 Apr 20
4
LOGIC DIAGRAM (ONE FLIP-FLOP)
Q
Q
C
C
C
C
C
C
C
C
D
C
C
RD
SD
CP
SV00334
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP.
MAX
UNIT
VCC
DC supply voltage
See Note1
1.0
3.3
5.5
V
VI
Input voltage
0
VCC
V
VO
Output voltage
0
VCC
V
Tamb
Operating ambient temperature range in free
air
See DC and AC
characteristics
–40
–40
+85
+125
°C
tr, tf
Input rise and fall times except for
Schmitt-trigger inputs
VCC = 1.0V to 2.0V
VCC = 2.0V to 2.7V
VCC = 2.7V to 3.6V
VCC = 3.6V to 5.5V
500
200
100
50
ns/V
NOTE:
1. The LV is guaranteed to function down to VCC = 1.0V (input levels GND or VCC); DC characteristics are guaranteed from VCC = 1.2V to VCC = 5.5V.
ABSOLUTE MAXIMUM RATINGS1, 2
In accordance with the Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC
DC supply voltage
–0.5 to +7.0
V
±IIK
DC input diode current
VI < –0.5 or VI > VCC + 0.5V
20
mA
±IOK
DC output diode current
VO < –0.5 or VO > VCC + 0.5V
50
mA
±IO
DC output source or sink current
– standard outputs
–0.5V < VO < VCC + 0.5V
25
mA
±IGND,
±ICC
DC VCC or GND current for types with
–standard outputs
50
mA
Tstg
Storage temperature range
–65 to +150
°C
Power dissipation per package
for temperature range: –40 to +125
°C
Ptt
–plastic DIL
above +70
°C derate linearly with 12mW/K
750
mW
Ptot
–plastic mini-pack (SO)
above +70
°C derate linearly with 8 mW/K
500
mW
–plastic shrink mini-pack (SSOP and TSSOP)
above +60
°C derate linearly with 5.5 mW/K
400
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.


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