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74LV393 Datasheet(PDF) 4 Page - NXP Semiconductors

Part No. 74LV393
Description  Dual 4-bit binary ripple counter
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Maker  PHILIPS [NXP Semiconductors]
Homepage  http://www.nxp.com
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74LV393 Datasheet(HTML) 4 Page - NXP Semiconductors

 
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Philips Semiconductors
Product specification
74LV393
Dual 4-bit binary ripple counter
1998 Jun 10
4
LOGIC DIAGRAM
CP
MR
TT
T
T
Q
RD
FF1
Q
RD
FF2
Q
RD
FF3
Q
RD
FF4
Q0
Q1
Q2
Q3
SV00677
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNIT
VCC
DC supply voltage
See Note 1
1.0
3.3
3.6
V
VI
Input voltage
0
VCC
V
VO
Output voltage
0
VCC
V
Tamb
Operating ambient temperature range in free
air
See DC and AC
characteristics
–40
–40
+85
+125
°C
tr, tf
Input rise and fall times
VCC = 1.0V to 2.0V
VCC = 2.0V to 2.7V
VCC = 2.7V to 3.6V
500
200
100
ns/V
NOTES:
1. The LV is guaranteed to function down to VCC = 1.0V (input levels GND or VCC); DC characteristics are guaranteed from VCC = 1.2V to VCC =3.6V.
ABSOLUTE MAXIMUM RATINGS1, 2
In accordance with the Absolute Maximum Rating System (IEC 134).
Voltages are referenced to GND (ground = 0V).
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC
DC supply voltage
–0.5 to +4.6
V
±IIK
DC input diode current
VI < –0.5 or VI > VCC + 0.5V
20
mA
±IOK
DC output diode current
VO < –0.5 or VO > VCC + 0.5V
50
mA
±IO
DC output source or sink current
– standard outputs
–0.5V < VO < VCC + 0.5V
25
mA
±IGND,
±ICC
DC VCC or GND current for types with
– standard outputs
50
mA
Tstg
Storage temperature range
–65 to +150
°C
PTOT
Power dissipation per package
– plastic DIL
– plastic mini-pack (SO)
– plastic shrink mini-pack (SSOP and TSSOP)
for temperature range: –40 to +125
°C
above +70
°C derate linearly with 12 mW/K
above +70
°C derate linearly with 8 mW/K
above +60
°C derate linearly with 5.5 mW/K
750
500
400
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.


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