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74HCT4066 Datasheet(PDF) 15 Page - NXP Semiconductors |
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74HCT4066 Datasheet(HTML) 15 Page - NXP Semiconductors |
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15 / 24 page  1998 Nov 10 15 Philips Semiconductors Product specification Quad bilateral switches 74HC/HCT4066 Fig.15 Test circuit for measuring minimum frequency response. Adjust input voltage to obtain 0 dBM at Vos when fin = 1 MHz. After set-up frequency of fin is increased to obtain a reading of −3 dB at Vos. handbook, full pagewidth 0.1 µF 2RL 2RL Vos VCC Vis CL dB nZ/nY nY/nZ GND MGR269 sine-wave channel ON Fig.16 Test circuit for measuring sine wave distortion. handbook, full pagewidth MGR270 10 µF 2RL 2RL Vos VCC Vis CL DISTORTION METER nZ/nY nY/nZ GND fin = 1 kHz sine-wave channel ON Fig.17 Test circuit for measuring switch “OFF” signal feed-through. handbook, full pagewidth 0.1 µF 2RL 2RL Vos VCC Vis CL dB nZ/nY nY/nZ GND channel OFF MGR271 |
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