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MNDS90LV031A-X Datasheet(PDF) 1 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. MNDS90LV031A-X
Description  3V LVDS Quad CMOS Differential Line Driver
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

MNDS90LV031A-X Datasheet(HTML) 1 Page - National Semiconductor (TI)

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Original Creation Date: 02/09/99
Last Update Date: 08/15/03
Last Major Revision Date: 02/21/00
MNDS90LV031A-X REV 1C0
MICROCIRCUIT DATA SHEET
3V LVDS Quad CMOS Differential Line Driver
General Description
The DS90LV031A is a quad CMOS differential line driver utilizing Low Voltage
Differentional Signaling (LVDS) technology.
It is designed for applications requiring low
power dissipation and high data rates.
The DS90LV031A accepts TTL/CMOS input levels and translates them to low voltage (350 mV)
differential output siginals. In addition the driver supports a TRI-STATE function that
may be used to disable the output stage, disabling the load current, and thus dropping the
device to a low idle power state.
The EN and EN* inputs allow active Low or active High control of the TRI-STATE outputs.
The enables are common to all four drivers. The DS90LV031A and companion line receiver
(DS90LV032A) provide a new alternative to high power pseudo-ECL devices for high speed
point-to-point interface applications.
In addition, the DS90LV031A provides power-off high impedance LVDS outputs. This feature
assures minimal loading effect on the LVDS bus lines when VCC is not present.
NS Part Numbers
DS90LV031AW-MLS
DS90LV031AW-QML
DS90LV031AWGMLS
DS90LV031AWGQML
Industry Part Number
DS90LV031A
Prime Die
DS90LV031A
Controlling Document
SEE FEATURES SECTION
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1


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