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MNDS26C31M-X Datasheet(PDF) 1 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. MNDS26C31M-X
Description  CMOS QUAD TRI-STATE DIFFERENTIAL LINE DRIVER
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

MNDS26C31M-X Datasheet(HTML) 1 Page - National Semiconductor (TI)

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Original Creation Date: 01/23/96
Last Update Date: 05/04/01
Last Major Revision Date: 01/23/96
MNDS26C31M-X REV 0B0
MICROCIRCUIT DATA SHEET
CMOS QUAD TRI-STATE DIFFERENTIAL LINE DRIVER
General Description
The DS26C31 is a qual differential line driver designed for digital data transmission over
balanced lines. The DS26C31 meets all the requirements of EIA standard RS-422 while
retaining the low power characteristics of CMOS. This enables the construction of serial
and terminal interfaces while maintaining minimal power consumption.
The DS26C31 accepts TTL or CMOS input levels and translates these to RS-422 output levels.
This part uses special output circuitry that enables the individual drivers to power down
without loading down the bus. This device has enable and disable circuitry common to all
four drivers. The DS26C31 is pin compatible to the AM26LS31 and the DS26LS31.
All inputs are protected against damage due to electrostatic discharge by diodes to Vcc
and ground.
NS Part Numbers
DS26C31ME/883
DS26C31MJ/883
DS26C31MW/883
DS26C31MWG/883
Industry Part Number
DS26C31
Prime Die
DS26C31
Controlling Document
SEE FEATURES SECTION
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1


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