Electronic Components Datasheet Search |
|
N74F711-1D Datasheet(PDF) 7 Page - NXP Semiconductors |
|
N74F711-1D Datasheet(HTML) 7 Page - NXP Semiconductors |
7 / 16 page Philips Semiconductors Product specification 74F711A/74F711–1/ 74F712A/74F712–1 Multiplexers 1990 Dec 13 7 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX IO = 3mA ±10%VCC 2.4 V VO High level output voltage VCC = MIN, V MAX IOH = –3mA ±5%VCC 2.7 3.4 V VOH High-level output voltage VIL = MAX, VIH = MIN IO = 15mA ±10%VCC 2.0 V IH IOH = –15mA ±5%VCC 2.0 V 74F711A/ 74F712A IO = MAX ±10%VCC 0.38 0.55 V VOL Low-level output voltage 74F712A only VCC = MIN, VIL = MAX, IOL = MAX ±5%VCC 0.42 0.55 V OL g 74F711-1/ 74F712-1 IL , VIH = MIN IOL = 5mA ±10%VCC 0.38 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA I Low level input current Others VCC = MAX V =0 5V –20 µA IIL Low-level input current Dn only VCC = MAX, VI = 0.5V –40 µA IOZH Off-state output current High-level voltage applied 74F711A/ 74F711 1 VCC = MAX, VO = 2.7V 50 µA IOZL Off-state output current Low-level voltage applied 74F711-1 only VCC = MAX, VO = 0.5V –50 µA IOS Short-circuit output current3 74F711-1/ 74F712-1 VCC = MAX –60 –150 mA IO Output current4 74F711A/ 74F712A VCC = MAX, VO = 2.25 V –60 –150 mA ICCH 25 35 mA 74F711A ICCL VCC = MAX 33 46 mA ICCZ 27 40 mA ICCH 26 40 mA ICC Supply current 74F711-1 ICCL VCC = MAX 33 45 mA ICC current (total) ICCZ 28 45 mA () 74F712A ICCH VCC = MAX 20 27 mA 74F712A ICCL VCC = MAX 30 40 mA 74F712 1 ICCH VCC = MAX 20 30 mA 74F712-1 ICCL VCC = MAX 29 40 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 4. IO is tested under conditions that produce current approximity one half of the true short-circuit output current (IOS). |
Similar Part No. - N74F711-1D |
|
Similar Description - N74F711-1D |
|
|
Link URL |
Privacy Policy |
ALLDATASHEET.COM |
Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Datasheet Upload | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |