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N74F676N Datasheet(PDF) 4 Page - NXP Semiconductors |
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N74F676N Datasheet(HTML) 4 Page - NXP Semiconductors |
4 / 10 page Philips Semiconductors Product specification 74F676 16-bit serial/parallel-in, serial-out shift register (3-State) 1990 Apr 18 4 ABSOLUTE MAXIMUM RATINGS (Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free-air temperature range.) SYMBOL PARAMETER RATING UNIT VCC Supply voltage –0.5 to +7.0 V VIN Input voltage –0.5 to +7.0 V IIN Input current –30 to +5.0 mA VOUT Voltage applied to output in High output state –0.5 to +VCC V IOUT Current applied to output in Low output state 40 mA Tamb Operating free-air temperature range 0 to +70 °C Tstg Storage temperature –65 to +150 °C RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT SYMBOL PARAMETER MIN NOM MAX UNIT VCC Supply voltage 4.5 5.0 5.5 V VIH High-level input voltage 2.0 V VIL Low-level input voltage 0.8 V IIK Input clamp current –18 mA IOH High-level output current –1 mA IOL Low-level output current 20 mA Tamb Operating free-air temperature range 0 70 °C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) NO TAG LIMITS SYMBOL PARAMETER TEST CONDITIONSNO TAG MIN TYP NO TAG MAX UNIT VO High level output voltage VCC = MIN, VIL = MAX, ±10%VCC 2.5 V VOH High-level output voltage CC , IL , VIH = MIN, IOH = MAX ±5%VCC 2.7 3.4 V VO Low level output voltage VCC = MIN, VIL = MAX, ±10%VCC 0.30 0.50 V VOL Low-level output voltage CC , IL , VIH = MIN, IOL = MAX ±5%VCC 0.30 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –0.6 mA IOS Short-circuit output currentNO TAG VCC = MAX –60 –150 mA ICC Supply current (total) VCC = MAX 48 72 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value under the recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS should be performed last. |
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