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N74620D Datasheet(PDF) 6 Page - NXP Semiconductors

Part No. N74620D
Description  Octal bus transceiver, inverting 3tate
Download  12 Pages
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Maker  PHILIPS [NXP Semiconductors]
Homepage  http://www.nxp.com
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N74620D Datasheet(HTML) 6 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74F620/74F623
Transceivers
1990 Apr 6
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NO TAG
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONSNO TAG
MIN
TYP
NO TAG
MAX
UNIT
A0–A7
IO = 3mA
±10%VCC
2.4
V
VO
High level output voltage
B0–B7
VCC = MIN,
VIL = MAX
IOH = –3mA
±5%VCC
2.7
3.3
V
VOH
High-level output voltage
B0 B7
VIL = MAX,
VIH = MIN
IO = 15mA
±10%VCC
2.0
V
B0–B7
IOH = –15mA
±5%VCC
2.0
V
A0 A7
IO = 24mA
±10%VCC
0.35
0.50
V
VO
Low level output voltage
A0–A7
VCC = MIN,
VIL = MAX
IOL = 24mA
±5%VCC
0.35
0.50
V
VOL
Low-level output voltage
B0 B7
VIL = MAX,
VIH = MIN,
IOL = 48mA
±10%VCC
0.38
0.55
V
B0–B7
IOL = 64mA
±5%VCC
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum
input voltage
OEBA,
OEAB
VCC = 0.0V, VI = 7.0V
100
µA
I
in ut voltage
others
VCC = 5.5V, VI = 5.5V
1
mA
IIH
High-level input current
OEBA,
OEAB
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
OEAB
only
VCC = MAX, VI = 0.5V
–20
µA
IOZH+IIH
Off-state output current,
High-level of voltage applied
A0–A7
VCC = MAX, VI = 2.7V
70
µA
IOZL+IIL
Off-state output current,
Low-level of voltage applied
B0–B7
VCC = MAX, VI = 0.5V
–70
µA
IOS
Short-circuit output cur-
NO TAG
A0–A7
VCC = MAX
–60
–150
mA
IOS
rentNO TAG
B0–B7
VCC = MAX
–100
–225
mA
ICCH
OEBA=OEAB=4.5V;
A0–A7=GND
70
92
mA
74F620
ICCL
VCC = MAX
OEBA=OEAB=4.5V;
A0–A7=4.5V
84
110
mA
ICC
Supply current
ICCZ
OEAB=GND;
OEBA=A0–A7=4.5V
84
110
mA
ICC
y
(total)
ICCH
OEBA=OEAB=4.5V;
A0–A7=4.5V
110
140
mA
74F623
ICCL
VCC = MAX
OEBA=OEAB=4.5V;
A0–A7=GND
110
140
mA
ICCZ
OEAB=GND;
OEBA=A0–A7=4.5V
99
130
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.


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