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74F543DB Datasheet(PDF) 7 Page - NXP Semiconductors |
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74F543DB Datasheet(HTML) 7 Page - NXP Semiconductors |
7 / 16 page Philips Semiconductors Product specification 74F543, 74F544 Octal registered transceivers 1994 Dec 5 7 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT A0 - A7, VCC = MIN IOH = -3mA "10%VCC 2.4 V VOH High-level output voltage A0 - A7 VCC = MIN VIL = MAX IOH = -3mA "5%VCC 2.7 3.4 V VOH High-level out ut voltage B0 - B7, VIL = MAX VIH = MIN IOH = -15mA "10%VCC 2.0 V B0 - B7 VIH MIN IOH = -15mA "5%VCC 2.0 V A0 - A7, VCC = MIN IOL = 24mA "10%VCC 0.35 0.50 V VOL Low-level output voltage A0 - A7 VCC = MIN VIL = MAX IOL = 24mA "5%VCC 0.35 0.50 V VOL Low-level out ut voltage B0 - B7, VIL = MAX VIH = MIN IOL = 64mA "10%VCC 0.55 V B0 - B7 VIH MIN IOL = 64mA "5%VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum OEAB, OEBA, EAB VCC = MAX, VI = 7.0 V 100 µA II input voltage Others VCC = 5.5, VI = 5.5V 1 mA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA Others –0.6 mA IIL Low-level input current EAB, EBA VCC = MAX, VI = 0.5V –1.2 mA IOZH + IIH Off-state output current, high-level voltage applied VCC= MAX, VO = 2.7V 70 µA IOZH + IIL Off-state output current, Low-level voltage applied VCC= MAX, VO = 0. 5V –600 µA IOS Short-circuit output current3 A0 - A7, A0 - A7 VCC = MAX –60 –150 mA IOS Short-circuit out ut current3 B0 - B7, B0 - B7 VCC = MAX –100 –225 mA ICCH 70 105 mA 74F543 ICCL VCC = MAX 95 135 mA ICC Supply current (total) ICCZ 95 135 mA ICC Su ly current (total) ICCH 80 110 mA 74F544 ICCL VCC = MAX 105 140 mA ICCZ 100 135 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under the recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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