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N74456N Datasheet(PDF) 7 Page - NXP Semiconductors

Part No. N74456N
Description  Buffers/drivers
Download  12 Pages
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Maker  PHILIPS [NXP Semiconductors]
Homepage  http://www.nxp.com
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N74456N Datasheet(HTML) 7 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74F455,* 74F456
Buffers/Drivers
1999 Jan 08
7
* Discontinued part. Please see the Discontinued Products List.
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
UNIT
VCC = MIN
IO = 3mA
±10%VCC
2.4
V
VOH
High-level output voltage
VCC = MIN,
VIL = MAX,
V
MIN
IOH=–3mA
±5%VCC
2.7
3.3
V
VIH = MIN
IOH =–15mA
±10%VCC
2.0
V
VO
Low level output voltage
VCC = MIN,
VIL = MAX
IO = MAX
±10%VCC
0.55
V
VOL
Low-level output voltage
VIL = MAX,
VIH = MIN
IOL = MAX
±5%VCC
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = 0.0V, VI = 7.0V
100
µA
I
High level input current
Dn
VCC = MAX V =2 7V
40
µA
IIH
High-level input current
Pl, OEn
VCC = MAX, VI = 2.7V
20
µA
I
Low level input current
Dn
VCC = MAX V =0 5V
–40
µA
IIL
Low-level input current
Pl, OEn
VCC = MAX, VI = 0.5V
–20
µA
IOZH
Off-state output current
High-level voltage applied
VCC = MAX, VO = 2.7V
50
µA
IOZL
Off-state output current
Low-level voltage applied
VCC = MAX, VO = 0.5V
–50
µA
IOS
Short-circuit output current3
VCC = MAX
–100
–225
mA
ICCH
50
80
mA
ICC
Supply current (total)
ICCL
VCC = MAX
78
110
mA
ICCZ
63
90
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
VCC = +5V
Tamb = +25°C
CL = 50pF, RL = 500Ω
VCC = +5V ± 10%
Tamb = 0°C to +70°C
CL = 50pF, RL = 500Ω
UNIT
MIN
TYP
MAX
MIN
MAX
tPLH
tPHL
Propagation delay
Dn to Qn
74F455
Waveform 2
2.0
1.0
4.5
2.0
6.5
4.0
2.0
1.0
7.5
4.5
ns
tPLH
tPHL
Propagation delay
Dn to Qn
74F456
Waveform 1
2.0
2.5
4.5
5.0
6.5
7.0
2.0
2.5
7.0
7.5
ns
tPLH
tPHL
Propagation delay
Dn to
SE, SO
Waveform 1, 2
5.5
5.5
10.0
11.0
13.0
14.5
5.5
5.5
14.0
16.5
ns
tPZH
tPZL
Output Enable time
to High or Low level
Waveform 3
Waveform 4
2.5
4.0
4.0
8.0
8.0
10.5
2.5
4.0
9.0
11.5
ns
tPHZ
tPLZ
Output Disable time
from High or Low level
Waveform 3
Waveform 4
1.5
2.0
4.0
5.0
6.5
7.5
1.5
2.0
7.5
8.0
ns


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