Electronic Components Datasheet Search
  English  ▼

Delete All
ON OFF
ALLDATASHEET.COM

X  

Preview PDF Download HTML

74F27 Datasheet(PDF) 4 Page - NXP Semiconductors

Part No. 74F27
Description  Triple 3-input NOR gate
Download  8 Pages
Scroll/Zoom Zoom In 100% Zoom Out
Maker  PHILIPS [NXP Semiconductors]
Homepage  http://www.nxp.com
Logo 

74F27 Datasheet(HTML) 4 Page - NXP Semiconductors

   
Zoom Inzoom in Zoom Outzoom out
 4 / 8 page
background image
Philips Semiconductors
Product specification
74F27
Triple 3-input NOR gate
February 5, 1991
4
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
MIN
TYP2
MAX
VOH
High-level output voltage
VCC = MIN, VIL = MAX
±10%VCC
2.5
V
VIH = MIN, IOH = MAX
±5%VCC
2.7
3.4
V
VOL
Low-level output voltage
VCC = MIN, VIL = MAX
±10%VCC
0.30
0.50
V
VIH = MIN, IOl = MAX
±5%VCC
0.30
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
-0.73
-1.2
V
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
100
µA
IIH
High–level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low–level input current
VCC = MAX, VI = 0.5V
-0.6
mA
IOS
Short-circuit output current3
VCC = MAX
-60
-150
mA
ICC
Supply current (total)
ICCH
VCC = MAX
VIN = GND
4.0
5.5
mA
ICCL
VCC = MAX
VIN = 4.5V
8.5
12.0
mA
NOTES:
1
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2
All typical values are at VCC = 5V, Tamb = 25°C.
3
Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
VCC = +5.0V
Tamb = +25°C
CL = 50pF, RL = 500Ω
VCC = +5.0V ± 10%
Tamb = 0°C to +70°C
CL = 50pF, RL = 500Ω
VCC = +5.0V ± 10%
Tamb = –40°C to +85°C
CL = 50pF, RL = 500Ω
UNIT
MIN
TYP
MAX
MIN
MAX
MIN
MAX
tPLH
tPHL
Propagation delay
Dna, Dnb, Dnc to Qn
Waveform 1
2.0
1.0
3.5
2.5
5.0
4.5
1.5
1.0
5.5
4.5
1.0
1.0
7.0
5.5
ns


Html Pages

1  2  3  4  5  6  7  8 


Datasheet Download



Related Electronics Part Number

Part NumberComponents DescriptionHtml ViewManufacturer
74ALS27Triple 3-Input NOR gate 1 2 3 4 5 MoreNXP Semiconductors
HEF4025BTriple 3-input NOR gate 1 2 3 NXP Semiconductors
M74HC27TRIPLE 3-INPUT NOR GATE 1 2 3 4 5 MoreSTMicroelectronics
TC74VHC27FTRIPLE 3-INPUT NOR GATE 1 2 3 4 5 Toshiba Semiconductor
74LCX27Low Voltage Triple 3-Input NOR Gate with 5V Tolerant Inputs 1 2 3 4 5 MoreFairchild Semiconductor
74VHC27Triple 3-Input NOR Gate 1 2 3 4 5 MoreFairchild Semiconductor
M74HCT27TRIPLE 3-INPUT NOR GATE 1 2 3 4 5 MoreSTMicroelectronics
IN74HC27ATriple 3-Input NOR Gate 1 2 3 4 5 Integral Corp.
SL4025BTriple 3-Input NOR Gate 1 2 3 4 System Logic Semiconductor
SN54LS27TRIPLE 3-INPUT NOR GATE 1 2 3 4 Motorola, Inc

Link URL




Privacy Policy
ALLDATASHEET.COM
Does ALLDATASHEET help your business so far?  [ DONATE ]  

About Alldatasheet   |   Advertisement   |   Datasheet Upload   |   Contact us   |   Privacy Policy   |   Alldatasheet API   |   Link Exchange   |   Manufacturer List
All Rights Reserved© Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn